Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression

Seo, Sungyoul; Lee, Yong; Kang, Sungho

doi:10.1109/tcad.2015.2413416

Cited by 7 publications

(2 citation statements)

References 37 publications

(43 reference statements)

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“…The proposed error-resilient data compression scheme can be beneficial in many applications that process a large volume of data and perform compression on the stored data to reduce storage requirements, such as ML [25], image/video processing [26], digital signal processing [27], wireless systems [28], and automatic test equipment [29]. Next, two ML applications are taken as examples to evaluate the effectiveness of the proposed scheme.…”

Section: Applicationsmentioning

confidence: 99%

Error-Resilient Data Compression With Tunstall Codes

Liu

Reviriego²,

Ullah

et al. 2023

IEEE Trans. Circuits Syst. I

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Data compression has been commonly employed to reduce the required memory size for emerging applications with large storage needs like Big Data and Machine Learning (ML). When considering the flexibility of decompression and its hardware implementation, variable-to-fixed length codes (e.g., Tunstall codes) are usually selected. However, memories are prone to suffer different types of errors, causing the stored data to be corrupted; if an error affects the compressed data, it can propagate and cause corruption in a sequence of bits of the decompressed data. Therefore, error resilience should be built-in as part of the memory design to provide reliable data, especially for safety-critical applications. However, Error Correction Codes (ECCs) that are widely used for memory protection, are not very efficient to protect compressed data, because ECCs further increase the memory size and the additional decoding process impacts the latency to decompress the stored data. In this paper, an efficient error-resilient data compression technique with Tunstall codes is proposed; it requires almost no memory overhead and can correct most errors during the decompression process by introducing a conversion table. An enhanced design is also presented to reduce the impact of errors when they cannot be corrected. The proposed scheme has been implemented and evaluated on three ML datasets; results show that it can deal with up to 99.98% errors with almost no memory overhead when Tunstall codes with smaller than 16-bit symbols are employed. The scheme has also been evaluated for two ML applications; results show that even though a small number of errors cannot be corrected in the proposed scheme, they have an extremely low impact on the classification results and the protection overhead is significantly lower than existing ECC techniques.

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Section: Applicationsmentioning

confidence: 99%

Error-Resilient Data Compression With Tunstall Codes

Liu

Reviriego²,

Ullah

et al. 2023

IEEE Trans. Circuits Syst. I

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“…However, although the average compression ratio of the test data of the technology reached 68.02%, it did not propose an optimization strategy for the data transmission after compression and failed to provide a positive effect in reducing test application time. Seo et al [26] proposed a three-state coding-based test data compression method using the last test data to generate the next one. The method did not require additional input ports, which further improved the compression ratio of the test data.…”

Section: State Of the Artmentioning

confidence: 99%

Test Stimuli Segmentation and Coding Method

2018

Teh. vjesn.

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Test vector coding and data transmission are the key technologies in the design-for-test of digital integrated circuits (IC). Existing parallel input methods of test stimuli can reduce test application times; however, they need to occupy multiple input ports. Thus, a novel method of test stimuli coding and data transmission was proposed to reduce the test application time of the test vectors and reduce the number of input ports required for the parallel input of test stimuli. This method was based on the segmentation of test stimuli. First, the test stimuli were evenly segmented into eight-bit wide. Second, the eight-bit data of each segment were encoded to the five-bit data according to the compatibility between the test data of each segment. The eight-bit test stimuli input can be completed in one or two clock cycles of automatic test equipment (ATE) by using the five input ports of the chip. The corresponding decoding circuit was added inside the netlist of the circuit to realize the rapid input of the test stimuli. Lastly, the ISCAS'89 benchmark circuit was used to conduct experiments, results of this coding method were then compared with those of the serial input method. Results show that the encoding method proposed in this study can save an average of 37% of the parallel input data width and 81.7% of the test stimuli input time. The proposed method in this study can also reduce the test application time and the cost of the IC test. The findings of this study can provide guidance for improving the scan testing method of digital IC.

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A Multiple Compatible Compression Scheme Based on Tri-state Signal

Tian

Zuo

et al. 2020

Studies in Distributed Intelligence

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Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression

Cited by 7 publications

References 37 publications

Error-Resilient Data Compression With Tunstall Codes

Error-Resilient Data Compression With Tunstall Codes

Test Stimuli Segmentation and Coding Method

A Multiple Compatible Compression Scheme Based on Tri-state Signal

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