Reducing Noises in Digital Surface Inspection Using a Data Clustering Approach

Skin Imaging: A Digital Twin for Geometric Deviations on Manufactured Surfaces

“…Closed-loop manufacturing is a specific application of this concept, which aims to optimize and control the manufacturing operations by using live data collected by sensors from the workpiece being manufactured. Optical measurement sensors have become more popular than contact coordinate measurement machines (CMM) for in-process coordinate metrology of the surface due to their fastness, higher resolution, and noncontact approach [1][2][3][4]. Cyber-Physical Integrated Inspection System (IIS) adds value to digital metrology to befit Industry 4.0 by reducing uncertainty based on the closed-loop implementation of three sequential tasks of coordinate metrology, i.e., Point Measurement Planning (PMP), Substitute Geometry Estimation (SGE), and Deviation Zone Evaluation (DZE).…”

“…Using the collected information by integrated inspection systems, manufacturing errors can either be corrected on-machine, or additional downstream manufacturing processes can be prescribed for error compensation [21]. Different methods and algorithms have been studied on the two first cyber components of IIS, i.e., PMP [3,[22][23][24][25][26][27] and SGE [28][29][30][31][32], but research on DZE is limited to fewer ones, despite its high significance. Poniatowska [33] proposed to use Non-Uniform Rational B-Spline (NURBS) parametric domain on measurement PCs to obtain spatial models of patterns left by the machining process on the surfaces; afterwards this measurement pattern model is superimposed on the nominal CAD model to obtain a CAD model of the product's surface, which can be used to determine areas of greatest deviations.…”