2018
DOI: 10.1039/c7ee02956j
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Reconsidering figures of merit for performance and stability of perovskite photovoltaics

Abstract: We propose a new approach for assessing the lifetimes of perovskite photovoltaics based on daily energy output which accounts for reversible diurnal changes.

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Cited by 84 publications
(75 citation statements)
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“…On the other hand, studies on the UV‐degradation of PSCs, and possible solution to enhance their lifespan, are widely available . It is worth highlighting that, both for PSCs and PDs, further studies to clarify the effects of reversible and irreversible UV‐induced degradation mechanisms under realistic experimental conditions are urgently needed . Currently, there is no intensity specification regarding UV light for wavelengths shorter than 400 nm on the standardized test conditions for solar simulator .…”
Section: Optoelectronic Propertiesmentioning
confidence: 99%
“…On the other hand, studies on the UV‐degradation of PSCs, and possible solution to enhance their lifespan, are widely available . It is worth highlighting that, both for PSCs and PDs, further studies to clarify the effects of reversible and irreversible UV‐induced degradation mechanisms under realistic experimental conditions are urgently needed . Currently, there is no intensity specification regarding UV light for wavelengths shorter than 400 nm on the standardized test conditions for solar simulator .…”
Section: Optoelectronic Propertiesmentioning
confidence: 99%
“…Not only does ionic migration play a crucial role in the device's current–voltage hysteresis, [ 9,10 ] but is also attributed the underpinning cause for both reversible and irreversible degradation of the perovskite absorber. [ 11,12 ] Since ionic defect formation, and consequent ionic defect movement, are evidently an integral part of the operation and stability of perovskite‐based optoelectronic devices, it is imperative to continue gaining an understanding of the migration dynamics.…”
Section: Introductionmentioning
confidence: 99%
“…More than one hundred different devices, using different materials or architectures, have been considered; all of them have been characterized following standard procedures when electrical parameters are reported, thus making a cross-comparison straightforward. This is not the case when stability is reported, a variety of methods and environmental conditions makes it very difficult for the cross-comparison; the stability data have been organized into two main groups in this review: stability reports for devices which are stored and characterized from time to time, and stability for devices which are characterized under continuous illumination; in both cases data for T 80 have been considered (sometimes directly reported, in other cases extrapolated from graphs or tables), since this is a recommended parameter to enable fair comparison between devices [14]. As mentioned above, the 'density' of information about stability has increased with time; initial reports focused mainly on efficiency and the hysteresis problem; recent reports more often include stability analysis.…”
Section: Introductionmentioning
confidence: 99%