Reconfigurable Field Programmable Gate Arrays for Mission-Critical Applications 2010
DOI: 10.1007/978-1-4419-7595-9_3
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Reconfigurable Field Programmable Gate Arrays: Failure Modes and Analysis

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Cited by 3 publications
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“…This potentially results in erroneous circuit behavior [7]. The effects of these so-called soft errors (as they are reversible in contrast to hard errors which occur in the manufacturing process or as a result of component aging [12]) can be reduced by using either (a) FPGA architectures which are less susceptible to particle hits ( [11], [13]), or (b) utilizing approaches which dynamically reconfigure soft error affected configuration partitions of a FPGA [14]. However, the first solution (a) induces that todays most sophisticated FPGA architectures (which are SRAM based) cannot be used anymore while the second solution (b) does not work for application SRAM resources.…”
Section: ) More Precisely Targeted Fault-containment Strategiesmentioning
confidence: 99%
“…This potentially results in erroneous circuit behavior [7]. The effects of these so-called soft errors (as they are reversible in contrast to hard errors which occur in the manufacturing process or as a result of component aging [12]) can be reduced by using either (a) FPGA architectures which are less susceptible to particle hits ( [11], [13]), or (b) utilizing approaches which dynamically reconfigure soft error affected configuration partitions of a FPGA [14]. However, the first solution (a) induces that todays most sophisticated FPGA architectures (which are SRAM based) cannot be used anymore while the second solution (b) does not work for application SRAM resources.…”
Section: ) More Precisely Targeted Fault-containment Strategiesmentioning
confidence: 99%