“…Test data volume and power reduction can be achieved by utilizing a built-in self-test (BIST) [5][6][7], test compaction [8,9] and test compression techniques [3,4,[10][11][12][13][14][15][16][17][18][19][20][21][22]. However, BIST requires a longer test application time, and it is extensively used for memory testing but is not common for logic testing [17].…”