2019
DOI: 10.1016/j.spmi.2019.106284
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Recombination pathways and hole leakage behavior in InGaN/GaN multiple quantum wells with V-shaped pits

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Cited by 6 publications
(4 citation statements)
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“…Nevertheless, the inserted n-AlGaN with a higher energy barrier can effectively suppress hole leakage, which may be the reason for the improved luminous efficacy of sample B at high current density regimes. [17] The semi-logarithmic scale current-voltage (I-V ) curves for both samples are shown in Fig. 2(b).…”
Section: Resultsmentioning
confidence: 99%
“…Nevertheless, the inserted n-AlGaN with a higher energy barrier can effectively suppress hole leakage, which may be the reason for the improved luminous efficacy of sample B at high current density regimes. [17] The semi-logarithmic scale current-voltage (I-V ) curves for both samples are shown in Fig. 2(b).…”
Section: Resultsmentioning
confidence: 99%
“…Meanwhile, the effect of silicon doping on the structural properties of AlGaN/GaN multiple quantum well layers grown on GaN was investigated [12]. However, with the continuous increase in Al composition and the limited technology for the epitaxial growth of materials, highquality AlGaN materials are difficult to prepare [13,14]; Besides, the ionization energy of the Mg acceptor in P-AlGaN is enhanced, making it difficult to dope and activate of highly transparent Mg-referenced p-AlGaN materials, thus affecting device performance [15][16][17]. However, Yun et alimproved the light extraction efficiency of the LED device by introducing cone-shaped pillars and cylindrical air holes in the highly transparent AlGaN layer at 280 nm [18].…”
Section: Introductionmentioning
confidence: 99%
“…However, due to the high dislocation density in AlGaN materials, spontaneous and piezoelectric polarization field effects, and weak carrier confinement, DUV-LDs with wavelengths less than 280 nm still have the problems of low hole concentration, serious carrier leakage, and low radiation recombination rate and output power [12][13][14]. The use of electron blocking layer (EBL) and hole blocking layer (HBL) can reduce carrier leakage, increase recombination rate, and optimize the performance of devices [15]. To solve the above problems, Xing et al proposed inverted trapezoidal EBL to reduce the electron leakage in the p-type region [16], Wang et al proposed graded EBL to improve the radiative recombination rate in the quantum wells (QWs) of DUV-LDs [17], and Yi et al proposed the specially designed AlGaN superlattice EBL and HBL based on rectangular superlattice (RSL) EBL and HBL [18]; then, they design AlGaN grade superlattice EBL and HBL to improve the performance of UV light-emitting diodes [19].…”
Section: Introductionmentioning
confidence: 99%