1998
DOI: 10.1063/1.121669
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Recombination lifetime of In0.53Ga0.47As as a function of doping density

Abstract: We have fabricated devices with the structure InP/In 0.53 Ga 0.47 As/InP, with a InGaAs doping range varying from 2ϫ10 14 to 2ϫ10 19 cm Ϫ3. These isotype double heterostructures were doped both n and p type and were used to measure the minority-carrier lifetime of InGaAs over this doping range. At the low doping end of the series, recombination is dominated by the Shockley-Read-Hall effect. At the intermediate doping levels, radiative recombination is dominant. At the highest doping levels, Auger recombination… Show more

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Cited by 172 publications
(80 citation statements)
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References 10 publications
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“…The lower radiative recombination efficiency of the n + InGaAs layer is associated with increased Auger recombination [40]. This is in strong agreement with observations made by Ahrenkiel and co-workers, showing that Auger recombination becomes the dominant recombination mechanism for doping densities greater than 5x10 18 cm −3 in InGaAs [41].…”
Section: Low Temperature Photoluminescence Spectroscopysupporting
confidence: 80%
“…The lower radiative recombination efficiency of the n + InGaAs layer is associated with increased Auger recombination [40]. This is in strong agreement with observations made by Ahrenkiel and co-workers, showing that Auger recombination becomes the dominant recombination mechanism for doping densities greater than 5x10 18 cm −3 in InGaAs [41].…”
Section: Low Temperature Photoluminescence Spectroscopysupporting
confidence: 80%
“…However, over 2 × 10 17 cm −3 , the dark current starts rising. The reasons are that the effective lifetime is dominated by SRH recombination, whose lifetime is independent with the doping concentration (Ahrenkiel et al 1998), at the rather low doping concentration. Thus, at this stage the effective lifetime is a constant.…”
Section: Resultsmentioning
confidence: 98%
“…The proportionality constant R 0 (CCCH), etc. were determined so that the calculated results agree with experimental values [36][37][38].…”
Section: Quantitative Answer To Faq 4: Carrier Thermalizationmentioning
confidence: 94%