Reciprocal space mapping

Fewster, Paul F.

doi:10.1080/10408439708241259

Cited by 130 publications

(86 citation statements)

References 68 publications

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“…These two effects may be distinguished by measuring a RSM around an asymmetrical Bragg reflection. [18] Fig. 2 d) shows that w x increases considerably for snapshots recorded after the reflection of the strain wave at the sample surface.…”

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“…This allowed for detecting symmetrically and asymmetrically diffracted x-ray photons at the same time, avoiding time-consuming mesh scans in order to measure reciprocal space maps (RSM) around specific Bragg reflections. [18][19][20][21] Consequently, we acquired information both on in-and out-of-plane structure dynamics utilizing this time-resolved version of reciprocal-space mapping. The temporal overlap of the optical pump and x-ray probe pulses was determined in an independent cross-correlation experiment [22] and was set to the delay 0 ps.…”

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Following Strain-Induced Mosaicity Changes of Ferroelectric Thin Films by Ultrafast Reciprocal Space Mapping

et al. 2013

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We investigate coherent phonon propagation in a thin film of ferroelectric PbZr0.2Ti0.8O3 (PZT) by ultrafast x-ray diffraction (UXRD) experiments, which are analyzed as time-resolved reciprocal space mapping (RSM) in order to observe the in-and out-of-plane structural dynamics simultaneously. The mosaic structure of the PZT leads to a coupling of the excited out-of-plane expansion to in-plane lattice dynamics on a picosecond timescale, which is not observed for out-of-plane compression.Oxides are attractive constituents of future nanoelectronic devices, because of their broad spectrum of outstanding physical properties, such as ferroelectricity and ferromagnetism, and owing to the progress made in the fabrication of high quality epitaxial heterostructures.[1] Epitaxial strain engineering and the careful choice of mechanical and electrical boundary conditions enable a direct influence on these functionalities.[2-6] Structural defects and nanoscale inhomogeneities, such as dislocations and domains, typically affect the properties of functional oxides and have been extensively studied by experiment and theory. [7,8] Ultrafast x-ray diffraction (UXRD) emerged as a powerful tool to observe lattice motion in real time [9][10][11] and has provided a deeper insight in the structure-property relations of functional oxides on ultrashort timescales. Recent femtosecond x-ray scattering experiments on ferroelectric oxides showed that electron screening induces an ultrafast piezoelectric response of the lattice [12] and that in turn the deformation leads to a change of the polarization.[13] However, these experiments were conducted on rather perfect epitaxial crystals. The influence of nano-domains has been considered in experiments on transient phases [14], but the role of static structural defects remained unexplored on such ultrafast timescale.Here we exemplify how ultrafast reciprocal space mapping (URSM) using a laser-based plasma x-ray source yields direct additional information on the reversible inplane structure dynamics in a ferroelectric perovskite PbZr 0.2 Ti 0.8 O 3 (PZT) film which is solely induced by the existence of dislocations typical of such materials. In particular, the width of the PZT Bragg reflection reports that tensile out of plane strain leads to drastically increased damping. The energy flows into in-plane strain which is evidenced by the in-plane component of the reciprocal space map. Our results indicate that in mismatched epitaxial films of oxide materials, with their high * daniel.schick@uni-potsdam.de • a-domains are embedded in the matrix of the c-axis grown tetragonal PZT film, as proved by the AFM topography image in b) as well. Misfit dislocations (MD) and threading dislocations (TD) formed at the SRO-PZT interface and across the PZT film, accounting for the lateral inhomogeneity on a sub-100 nm length scale.susceptibility to the formation of domains and dislocations, in-plane phenomena emerge on a hundred picosecond timescale. URSM yields the relevant information on lateral lattice dynamic...

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Following Strain-Induced Mosaicity Changes of Ferroelectric Thin Films by Ultrafast Reciprocal Space Mapping

et al. 2013

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“…Before the first demonstration of CDI, researchers were using the technique of reciprocal space mapping (RSM) to collect as much information about the diffracting sample as possible. 105 RSM involves the collection of Bragg reflections on the crystal rocking curve at very high angular resolution. RSM shares many common characteristics with the last technique we will discuss in this review, that of BCDI.…”

Section: Bragg Coherent Diffractive Imaging (Bcdi) Basic Principle Anmentioning

confidence: 99%

From Grain Boundaries to Single Defects: A Review of Coherent Methods for Materials Imaging in the X-ray Sciences

Abbey

2013

JOM

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“…An alloy's bandgap is determined from previously established empirical relationships linking E gap and alloy composition (0 ≤ x,y ≤ 1) to the values of the lattice parameters measured by x-ray diffraction. High-resolution x-ray diffraction (HRXRD) reciprocal space mapping (RSM) directly measures the in-plane and out-of-plane lattice parameters, strain, and the diffuse x-ray scattering from multilayered semiconductor heterostructures [3][4]. The technique was recently used to characterize strain-relaxation in linear and step-graded InP 1-x As x and In 1-z Al z As buffers grown by molecular beam epitaxy (MBE) [5][6][7].…”

Section: Introductionmentioning

confidence: 99%

Triple-axis X-ray Reciprocal Space Mapping of In(y)Ga(1-y)As Thermophotovoltaic Diodes Grown on (100) InP Substrates

Dashiell¹,

Ehsani²,

Sander³

et al. 2006

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Reciprocal space mapping

Cited by 130 publications

References 68 publications

Following Strain-Induced Mosaicity Changes of Ferroelectric Thin Films by Ultrafast Reciprocal Space Mapping

Following Strain-Induced Mosaicity Changes of Ferroelectric Thin Films by Ultrafast Reciprocal Space Mapping

From Grain Boundaries to Single Defects: A Review of Coherent Methods for Materials Imaging in the X-ray Sciences

Triple-axis X-ray Reciprocal Space Mapping of In(y)Ga(1-y)As Thermophotovoltaic Diodes Grown on (100) InP Substrates

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