Recent developments in X-ray projection microscopy and X-ray microtomography applied to materials science

Cazaux, J.; Erre, Damien; Mouze, D.; Patat, J. M.; Rondot, S.; Sasov, Alexander; Trebbia, P.; Zolfaghari, Afsoun

doi:10.1051/jp4:19937334

Cited by 14 publications

(15 citation statements)

References 4 publications

(4 reference statements)

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“…In the longer term, these concepts will also be applied to X-ray microtomography (following the way initiated by Thompson et al [37] and Hirano et al [38]) and to dynamic studies in X-ray microscopy [39]. At last, one may observe that some of the concepts developed here may also be adapted to conventional radiography and tomography.…”

Section: Proposed Approach: Determination Of the Concentrations Of Almentioning

confidence: 92%

A new quantification procedure for elemental mapping by X-ray (absorption) microscopy

Cazaux

1993

Microsc. Microanal. Microstruct.

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Abstract. 2014 In this paper, the principles of a new procedure for analytical X-ray microscopy (AXRM) are given and they apply for any kind of microscopes based on the use of conventional X-ray sources or of synchrotron radiation. Over the differential approach, its advantages are to minimize the number of irradiations to be used and its ability to map elements (or species) even when the investigated photon energy range does not include the threshold energy of some components. An additional advantage is that it permits to distinguish between thickness contrast and chemical contrast of the initial images via the thickness mapping. The factors influencing the precision on the concentrations measurements are discussed and it is shown that the sensitivity may reach 10-5 at/at. for the detection of medium elements embedded in very light matrices for photons in the 5-20 keV range. In fact, the measured intensities may be influenced by fluorescence effects and by the possible non-monochromaticity of the incident beams, mainly when classical X-ray sources are used (such as in X-ray projection microscopy) and correction procedures dealing with these effects are given. Some concepts developed here may also be adapted to conventional X-ray radiography and tomography.

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Section: Proposed Approach: Determination Of the Concentrations Of Almentioning

confidence: 92%

A new quantification procedure for elemental mapping by X-ray (absorption) microscopy

Cazaux

1993

Microsc. Microanal. Microstruct.

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“…See also: References B4,D3,E4,E11,E15,E31,E36,F5,F8,F9,F11,G1,K62,K107,L8,L13,L20,N4,U1,X5,Y5,Y9,AA8,BB1,BB2,BB7,CC8,EE1,EE2,EE5,EE6,EE8,EE14,FF1,FF2,FF5,FF7,FF14,FF15,FF18,FF21,FF24,HH9,HH21,II1,MM5,LL7,LL9,LL18,LL26,LL32,QQ6,…”

Section: Automated Image Analysis and Videomicroscopymentioning

confidence: 99%

Chemical Microscopy

Cooke

1996

Anal. Chem.

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“…Cazaux et al (1993) later developed a custom-built SEM CT system taking advantage of the availability of charge-coupled devices (CCD) for the acquisition of X-rays. In spite of promising performance, however, the technique received little attention for another decade.…”

Section: Introduction and Previous Workmentioning

confidence: 99%

High-resolution 3D analyses of the shape and internal constituents of small volcanic ash particles: The contribution of SEM micro-computed tomography (SEM micro-CT)

Vonlanthen

Rausch

Ketcham

et al. 2015

Journal of Volcanology and Geothermal Research

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The morphology of small volcanic ash particles is fundamental to our understanding of magma fragmentation, and in transport modeling of volcanic plumes and clouds. Until recently, the analysis of 3D features in small objects (b250 μm) was either restricted to extrapolations from 2D approaches, partial stereo-imaging, or CT methods having limited spatial resolution and/or accessibility. In this study, an X-ray computed-tomography technique known as SEM micro-CT, also called 3D X-ray ultramicroscopy (3D XuM), was used to investigate the 3D morphology of small volcanic ash particles (125-250 μm sieve fraction), as well as their vesicle and microcrystal distribution. The samples were selected from four stratigraphically well-established tephra layers of the Meerfelder Maar (West Eifel Volcanic Field, Germany). Resolution tests performed on a Beametr v1 pattern sample along with Monte Carlo simulations of X-ray emission volumes indicated that a spatial resolution of 0.65 μm was obtained for X-ray shadow projections using a standard thermionic SEM and a bulk brass target as X-ray source. Analysis of a smaller volcanic ash particle (64-125 μm sieve fraction) showed that features with volumes N 20 μm 3 (~3.5 μm in diameter) can be successfully reconstructed and quantified. In addition, new functionalities of the Blob3D software were developed to allow the particle shape factors frequently used as input parameters in ash transport and dispersion models to be calculated. This study indicates that SEM micro-CT is very well suited to quantify the various aspects of shape in fine volcanic ash, and potentially also to investigate the 3D morphology and internal structure of any object b 0.1 mm 3 .

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Recent developments in X-ray projection microscopy and X-ray microtomography applied to materials science

Abstract: Recent developments in X-ray projection microscopy and X-ray microtomography applied to materials science

Cited by 14 publications

References 4 publications

A new quantification procedure for elemental mapping by X-ray (absorption) microscopy

A new quantification procedure for elemental mapping by X-ray (absorption) microscopy

Chemical Microscopy

High-resolution 3D analyses of the shape and internal constituents of small volcanic ash particles: The contribution of SEM micro-computed tomography (SEM micro-CT)

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