2007 European Conference on Power Electronics and Applications 2007
DOI: 10.1109/epe.2007.4417564
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Recent developments in IGCT gate units

Abstract: Recent improvements in GCT silicon design have allowed increased turn-off capabilities for IGCTs thus placing greater demands on the gate-unit. This paper shows how the design challenges arising from this new turn-off capability have been addressed to re-establish "a balance" between the semiconductor and the gate unit for optimal IGCT performance.

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Cited by 7 publications
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“…could be identified as a function of the initial rate of rise of the gate current di g /dt directly after turn OFF and by assuming that at the beginning, the voltage of the OFF-channel capacitor C off stayed constant: v Coff = 20 V. This value can be considered as very low, when compared to the stray inductance of 1.1 nH of significantly larger commercial gate unit for 4 kA IGCTs [15].…”
Section: High-current Turn-off Validationmentioning
confidence: 99%
“…could be identified as a function of the initial rate of rise of the gate current di g /dt directly after turn OFF and by assuming that at the beginning, the voltage of the OFF-channel capacitor C off stayed constant: v Coff = 20 V. This value can be considered as very low, when compared to the stray inductance of 1.1 nH of significantly larger commercial gate unit for 4 kA IGCTs [15].…”
Section: High-current Turn-off Validationmentioning
confidence: 99%