Recent developments in BIPM voltage standard comparisons

Reymann, D.; Witt, Thomas J.; Vrabcek, P.; Tang, Yang; Hamilton, C.A.; Katkov, A. S.; Mendeleyev, Dmitry Ivanovich; Jeanneret, B.; Power, Oliver

doi:10.1109/19.918103

IEEE Trans. Instrum. Meas.

2001

DOI: 10.1109/19.918103

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Recent developments in BIPM voltage standard comparisons

D. Reymann

Thomas J. Witt

P. Vrabcek

et al.

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Cited by 18 publications

(1 citation statement)

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“…In conclusion, we have shown that arrays of YBCO shunted bicrystal junctions are suitable for metrological purposes at elevated temperatures. Presently, the quantum reference voltages achieved are used to develop dc voltage standards 15 with an uncertainty of the output voltage that is comparable to that typical of electronic standards based on Zener diodes, 16 but with noticeable advantages. The application of a reference voltage generated on HTS arrays permits one to ignore the influence of pressure, temperature and humidity on the output voltage of the standard.…”

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Accurate measurements of quantum voltage steps on arrays of bicrystal Josephson junctions

Клушин

Behr

Numssen

et al. 2002

Applied Physics Letters

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Quantum voltages of an array of YBa 2 Cu 3 O 7 bicrystal junctions were calibrated against a programmable Josephson array voltage standard. We demonstrated that steps of the current-voltage characteristic of an array of bicrystal junctions at voltages of about 9 mV were flat over the current range of about 80 A to within six parts in 10 8 . The coincidence of quantum voltages on the array of high-temperature superconductor junctions at 64 K and the reference voltage on the array of niobium junctions at 4.2 K was measured with an uncertainty of two parts in 10 8 . With the same uncertainty, we revealed the coincidence of the Josephson constant K J ϵh/2e in YBa 2 Cu 3 O 7 and in metallic superconductors.

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Accurate measurements of quantum voltage steps on arrays of bicrystal Josephson junctions

Клушин

Behr

Numssen

et al. 2002

Applied Physics Letters

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Portable Comparison Standard Based on the Josephson Effect

Katkov¹

2005

Meas Tech

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Investigation of the error in transferring the dimensions of the volt using a transportable stabilitron voltage standard

Katkov¹,

Krasnopolin²

2006

Meas Tech

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Recent developments in BIPM voltage standard comparisons

Cited by 18 publications

References 4 publications

Accurate measurements of quantum voltage steps on arrays of bicrystal Josephson junctions

Accurate measurements of quantum voltage steps on arrays of bicrystal Josephson junctions

Portable Comparison Standard Based on the Josephson Effect

Investigation of the error in transferring the dimensions of the volt using a transportable stabilitron voltage standard

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