2023
DOI: 10.1016/j.csbj.2023.01.006
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Recent development of computational cluster analysis methods for single-molecule localization microscopy images

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Cited by 10 publications
(8 citation statements)
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References 53 publications
(72 reference statements)
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“…Although we here developed the silica- or silicon-specific super-resolution imaging method, we expect that our development would be extended to the development of the super-resolution imaging method for other materials in the future, allowing the investigation of nanostructures and the detection of nanodefects in semiconductor materials with various compositions. Additionally, with the development of a fast camera with a relatively high frame rate and the fast single-molecule localization algorithm using deep learning, we anticipate that this method will yield significantly high-throughput metrology. , As the dye labeling process (∼1 h) can be performed for the entire whole wafer sample area at one time no matter how large the wafer is, the entire dye-labeled wafer sample is expected to be examined with high-throughput when automatic mosaic STORM imaging is combined with the use of a high frame rate camera . Given its high labeling density, high chemical specificity, single-molecule sensitivity, and nanoscale resolution, our new fluorophore labeling and imaging approach for inorganic nanomaterials is ideal for the functional characterization of nanopatterns in silicon wafers, driving further innovation of metrology tools and applications.…”
Section: Discussionmentioning
confidence: 99%
“…Although we here developed the silica- or silicon-specific super-resolution imaging method, we expect that our development would be extended to the development of the super-resolution imaging method for other materials in the future, allowing the investigation of nanostructures and the detection of nanodefects in semiconductor materials with various compositions. Additionally, with the development of a fast camera with a relatively high frame rate and the fast single-molecule localization algorithm using deep learning, we anticipate that this method will yield significantly high-throughput metrology. , As the dye labeling process (∼1 h) can be performed for the entire whole wafer sample area at one time no matter how large the wafer is, the entire dye-labeled wafer sample is expected to be examined with high-throughput when automatic mosaic STORM imaging is combined with the use of a high frame rate camera . Given its high labeling density, high chemical specificity, single-molecule sensitivity, and nanoscale resolution, our new fluorophore labeling and imaging approach for inorganic nanomaterials is ideal for the functional characterization of nanopatterns in silicon wafers, driving further innovation of metrology tools and applications.…”
Section: Discussionmentioning
confidence: 99%
“…While software packages for reconstruction and visualization of SMLM data are well-developed, [11] approaches for quantitative analysis of 2D or 3D point cloud data remain limited. Clustering analysis methods for SMLM include statistical, Bayesian, density-based, correlation-based, tessellation-based, image-based, and machine-learning based approaches [12, 13] . Previously, we applied batch SuperResNET network analysis to SMLM data for caveolin-1 (CAV1) and identified caveolae and three distinct classes of non-caveolar scaffolds [14-16] .…”
Section: Introductionmentioning
confidence: 99%
“…REPLOM utilizes the kinetic behaviour of self-assembly systems and photobleaching by surface docking in a photo-unstable environment, unlocking the temporal resolution of self-assembly kinetic pathways. Despite progress in acquiring these information-rich data sets, the analysis and identification of individual protein assemblies in SMLM are often reliant on manual annotations or system-specific approaches which are resource and time-strenuous and lack generalisation [29][30][31] .…”
mentioning
confidence: 99%
“…The advancement of machine learning-based approaches [32][33][34][35][36][37][38][39][40][41][42] has been instrumental for quantitative image analysis 30,43,44 and has the potential to resolve the bottleneck of extraction of assemblies of interest in super-resolution data. In general, these approaches can be broadly categorised as either supervised or unsupervised, each of which has advantages and limitations 30 .…”
mentioning
confidence: 99%
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