EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronic 2008
DOI: 10.1109/esime.2008.4525107
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Recent advances in drop-impact reliability

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Cited by 15 publications
(16 citation statements)
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“…Further evidence of fatigue as the micro-damage mechanism was provided by Seah et al [35] and Wong et al [38] in their reports of the PCB strain (S) to cycles-to-failure (N) characteristics of solder joints. A prevalence of fatigue damage of solder joints is observed for the range of PCB strain amplitudes between 1000 and 3000 micro-strain (Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 94%
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“…Further evidence of fatigue as the micro-damage mechanism was provided by Seah et al [35] and Wong et al [38] in their reports of the PCB strain (S) to cycles-to-failure (N) characteristics of solder joints. A prevalence of fatigue damage of solder joints is observed for the range of PCB strain amplitudes between 1000 and 3000 micro-strain (Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 94%
“…Conclusive evidence of fatigue as the micro-damage mechanism was provided by Caers et al [55] and Wong et al [38] in their investigation of the crack propagation in the solder joints of a PCB assembly subjected to cyclic bending at a PCB strain amplitude of 1800 micro-strain and bending frequency 100 Hz. Stable crack propagation was observed with increasing bending cycles (Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 96%
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