“…Further evidence of fatigue as the micro-damage mechanism was provided by Seah et al [35] and Wong et al [38] in their reports of the PCB strain (S) to cycles-to-failure (N) characteristics of solder joints. A prevalence of fatigue damage of solder joints is observed for the range of PCB strain amplitudes between 1000 and 3000 micro-strain (Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 94%
“…Conclusive evidence of fatigue as the micro-damage mechanism was provided by Caers et al [55] and Wong et al [38] in their investigation of the crack propagation in the solder joints of a PCB assembly subjected to cyclic bending at a PCB strain amplitude of 1800 micro-strain and bending frequency 100 Hz. Stable crack propagation was observed with increasing bending cycles (Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 96%
“…Experimental evidence for the dependence of the fatigue life of solder joints on the bending frequency of PCB, which is related to bending mode, were provided by Seah et al [35] and Wong et al [38], respectively. Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 97%
“…A comprehensive study comparing BIST and BLDST was also performed under the same consortium consisting of Institute of Microelectronics, Philips/NXP, Freescale, and ASE [36,38,54]. BIST was performed at two shear speeds of 0.5 m/s and 1 m/s.…”
Section: Correlating the Ball Impact Shear Test (Bist) With The Boardmentioning
confidence: 99%
“…A comprehensive study correlating the BLDST and the HSCBT was performed under a consortium consisting of the Institute of Microelectronics, Philips/NXP, Freescale, and ASE [36][37][38]. Two separate studies were performed.…”
Section: Correlating the High Speed Cyclic Bending Test (Hscbt) With mentioning
“…Further evidence of fatigue as the micro-damage mechanism was provided by Seah et al [35] and Wong et al [38] in their reports of the PCB strain (S) to cycles-to-failure (N) characteristics of solder joints. A prevalence of fatigue damage of solder joints is observed for the range of PCB strain amplitudes between 1000 and 3000 micro-strain (Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 94%
“…Conclusive evidence of fatigue as the micro-damage mechanism was provided by Caers et al [55] and Wong et al [38] in their investigation of the crack propagation in the solder joints of a PCB assembly subjected to cyclic bending at a PCB strain amplitude of 1800 micro-strain and bending frequency 100 Hz. Stable crack propagation was observed with increasing bending cycles (Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 96%
“…Experimental evidence for the dependence of the fatigue life of solder joints on the bending frequency of PCB, which is related to bending mode, were provided by Seah et al [35] and Wong et al [38], respectively. Fig.…”
Section: Damage and Failure Modelsmentioning
confidence: 97%
“…A comprehensive study comparing BIST and BLDST was also performed under the same consortium consisting of Institute of Microelectronics, Philips/NXP, Freescale, and ASE [36,38,54]. BIST was performed at two shear speeds of 0.5 m/s and 1 m/s.…”
Section: Correlating the Ball Impact Shear Test (Bist) With The Boardmentioning
confidence: 99%
“…A comprehensive study correlating the BLDST and the HSCBT was performed under a consortium consisting of the Institute of Microelectronics, Philips/NXP, Freescale, and ASE [36][37][38]. Two separate studies were performed.…”
Section: Correlating the High Speed Cyclic Bending Test (Hscbt) With mentioning
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