2007
DOI: 10.12693/aphyspola.112.1107
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Realization of a Phase Noise Measurement Bench Using Cross Correlation and Double Optical Delay Line

Abstract: In this paper there are presented first results obtained with a phase noise measurement bench operating in X-band, realized in our laboratory, using double optical delay line and cross correlation. Phase noise floor using a microwave sapphire oscillator is better than -160 dB rad 2 /Hz at 10 kHz from the 10 GHz carrier, using a 2 km optical delay line.

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Cited by 20 publications
(14 citation statements)
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“…Further work consists in measuring the phase noise on dedicated instruments developed at the laboratory [5,6]. It also consists in reducing or eliminating sensitivity to vibration by using a refractive index adaptator gel or other type of coupler.…”
Section: Discussionmentioning
confidence: 99%
“…Further work consists in measuring the phase noise on dedicated instruments developed at the laboratory [5,6]. It also consists in reducing or eliminating sensitivity to vibration by using a refractive index adaptator gel or other type of coupler.…”
Section: Discussionmentioning
confidence: 99%
“…The delivered power is higher than 1 dBm [7,8]. Such power is enough to allow characterization by optoelectronic phase noise measurements systems [9].…”
Section: Coupling Process At Femto-stmentioning
confidence: 97%
“…Even if an optical line can be used as a frequency-selective component in the OEO loop, the use of the mini-resonator leads to a significant reduction of the oscillator size. Further work consists in measuring the phase noise on dedicated instruments developed at the laboratory [16,17]. We can also reduce or eliminate sensitivity to vibration by using a refractive index adapter gel.…”
Section: Coupling With a Passive Resonator And Integration Into An Osmentioning
confidence: 99%