Optical Mini-Disk Resonator Integrated into a Compact Optoelectronic Oscillator

Salzenstein, Patrice; Tavernier, Hervé; Volyanskiy, Kirill; Kim, N.N.T.; Larger, Laurent; Rubiola, Enrico

doi:10.12693/aphyspola.116.661

Cited by 11 publications

(3 citation statements)

References 6 publications

(6 reference statements)

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“…Then coupled resonator is included into an oscillator and provides microwave oscillations stabilized to the resonator free spectral range, in the X-band region as predicted by the FSR. The delivered power is higher than 1 dBm [7,8]. Such power is enough to allow characterization by optoelectronic phase noise measurements systems [9].…”

Section: Coupling Process At Femto-stmentioning

confidence: 97%

Resonance measurements techniques of optical whispering gallery mode mini-disc resonators for microwave photonics applications

et al. 2011

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International audienceThe aim of this work is to compare advantages and disadvantages of different techniques for coupling a mini-disc-optical-resonator to determine quality factor of its resonance. Optical fiber coupled to a resonator consists in a mini disc with whispering gallery modes at its circumference. We choose to work with three materials and design compact miniresonators. Fused silica is found to be suitable for these applications thanks to its hardness in the range 6-7 and the behavior to mechanical shocks, despite its sensitivity to water pollution. With its tetragonal crystal and a good behavior with risk of water pollution, Calcium fluoride is a good candidate despite sensitivity to mechanical shocks. Magnesium fluoride is the third material used. As a critical step, taper coupling is set with a 20nm resolution positioning system. Miniresonator is excited from a system equipped with a tunable laser diode with a tunability from 1490 to 1640 nm and a linewidth narrower than 300kHz. Light is coupled into the microsphere either from glass or fiber prism or with fiber taper via evanescent field. We have also used a single frequency 660nm laser diode with a linewidth narrower than 100kHz which can be tuned about 10pm to test a single resonant peak. Both sources are used with either a tapered fiber or a filed fiber. Resonance is observed and quality factor of the resonators is found to be in the range of 10(8)

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Section: Coupling Process At Femto-stmentioning

confidence: 97%

Resonance measurements techniques of optical whispering gallery mode mini-disc resonators for microwave photonics applications

et al. 2011

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“…MgF 2 crystals are the preferred materials for manufacturing infrared windows and resonators due to their high mechanical strength, excellent optical properties, high temperature resistance, and corrosion resistance. These crystals are widely used in aerospace, electronic communication, and optical fields [1][2][3]. However, MgF 2 crystals are typical hard-to-machine materials owing to their distinct mechanical anisotropy and high brittleness [4][5][6][7].…”

Section: Introductionmentioning

confidence: 99%

Understand anisotropy dependence of damage evolution and material removal during nanoscratch of MgF₂ single crystals

Piao

Zhang

et al. 2022

Int. J. Extrem. Manuf.

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To understand the anisotropy dependence of the damage evolution and material removal during the machining process of MgF2 single crystals, nanoscratch tests of MgF2 single crystals of different crystal planes and directions were systematically performed, and surface morphologies of scratched grooves under different conditions were analyzed. The experimental results indicated that the anisotropy had a significant influence on the damage evolution in the machining process of MgF2 single crystals. The stress field model induced by the scratch was developed by considering the anisotropy, which indicated that median cracks induced by the tensile stress initiated and propagated at the front of the indenter during the loading process. Lateral cracks induced by tensile stress initiated and propagated on the subsurface during the unloading process. In addition, surface radial cracks induced by the tensile stress were easy to generate during the unloading process. The stress change led to the deflection of the propagation direction of lateral cracks, so that the lateral cracks propagated to the workpiece surface and resulted in the brittle removal in the form of chunk chips. The plastic deformation parameter indicated that the more slip systems were activated, the more easily plastic deformation occurred. The cleavage fracture parameter indicated that the cracks propagated along the activated cleavage planes, and the brittle chunk removal was caused by the subsurface cleavage cracks propagating to the crystal surface. Under the same processing parameters, the scratch of the (001) crystal plane along the [100] crystal-orientation is most conducive to achieving the plastic machining of MgF2 single crystals. The theoretical results agreed well with the experimental results, which will not only enhance the understanding of anisotropy dependence of damage evolution and removal process during machining of MgF2 crystals, but also provide a theoretical foundation for achieving the high-efficiency and low-damage processing of anisotropy single crystals.

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“…Radio frequency [1,2,3] or microwaves oscillators or optoelectronic oscillators with fiber delay line [4,5] and their further development with optical resonators [6,7,8,9], and cryogenic sapphire oscillators [10] can all present interesting performances with ultra-stable signals in short term domain characterized by a low phase noise. A convenient method is to lock the oscillator to be measured on a reference standard [11,12,13].…”

Section: Introductionmentioning

confidence: 99%

Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application

et al. 2011

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International audienceThe performance advances in communication systems like Radar system, precision navigation, space application and time and frequency metrology require more stable frequency and low phase noise system. Here is presented a configuration of phase noise measurement system operating in X-band using a photonic delay line as a frequency discriminator. This system doesn't need any excellent frequency reference and works for any frequency between 8.2 and 12.4 GHz. Using cross correlation on 500 averages, noise floor of the instrument is respectively -150 and -170 dBc/Hz at 10(1) and 10(4) Hz from the 10 GHz carrier (-90 and -170 dBc/Hz including 2 km delay lines). This instrument is developed in the context of association with the national french metrology institute (laboratoire national de metrologie et d'essais, LNE). This calibration system is to be integrated in measurements means of the accredited laboratory to improve the Calibration Metrology Capabilities (CMC) of the LNE

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Optical Mini-Disk Resonator Integrated into a Compact Optoelectronic Oscillator

Abstract: This work consists in the design, fabrication and characterization of mini-disk MgF 2 resonators for integration into optoelectronic oscillator and first experimental results of implementation in microwave free spectral range oscillator with taper coupling optoelectronic oscillator.

Cited by 11 publications

References 6 publications

Resonance measurements techniques of optical whispering gallery mode mini-disc resonators for microwave photonics applications

Resonance measurements techniques of optical whispering gallery mode mini-disc resonators for microwave photonics applications

Understand anisotropy dependence of damage evolution and material removal during nanoscratch of MgF₂ single crystals

Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application

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Optical Mini-Disk Resonator Integrated into a Compact Optoelectronic Oscillator

Abstract: This work consists in the design, fabrication and characterization of mini-disk MgF 2 resonators for integration into optoelectronic oscillator and first experimental results of implementation in microwave free spectral range oscillator with taper coupling optoelectronic oscillator.

Cited by 11 publications

References 6 publications

Resonance measurements techniques of optical whispering gallery mode mini-disc resonators for microwave photonics applications

Resonance measurements techniques of optical whispering gallery mode mini-disc resonators for microwave photonics applications

Understand anisotropy dependence of damage evolution and material removal during nanoscratch of MgF2 single crystals

Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application

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Product

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Understand anisotropy dependence of damage evolution and material removal during nanoscratch of MgF₂ single crystals