2014 IEEE 15th Workshop on Control and Modeling for Power Electronics (COMPEL) 2014
DOI: 10.1109/compel.2014.6877142
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Real-time thermal monitoring of power semiconductors in power electronics using linear parameter-varying models for variable coolant flow situations

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Cited by 20 publications
(6 citation statements)
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“…Representing a power device generating high temperature, two commercial SMD type resistors are used as a heat source (each size: 6.4mm × 3.2mm × 0.5mm). The total size of the two resistors is identical with the dimension of real IGBT devices [19,21].…”
Section: A Fabrication Of the Simplied Power Modulementioning
confidence: 99%
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“…Representing a power device generating high temperature, two commercial SMD type resistors are used as a heat source (each size: 6.4mm × 3.2mm × 0.5mm). The total size of the two resistors is identical with the dimension of real IGBT devices [19,21].…”
Section: A Fabrication Of the Simplied Power Modulementioning
confidence: 99%
“…Temperature elevation increases the resistor value, and sequentially changes current passing through the resistors. Also, the resistor can detect wire bond lift-off [19] or unbalanced device currents [20,21]. This method provides in-situ and real-time measurements with minor modifications in module design.…”
Section: Introductionmentioning
confidence: 99%
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“…In addition, in the process of analyzing the lifetime of the IGBT in rail transportation areas, the low cycle junction temperature fluctuations caused by the acceleration, idling, and deceleration speed conditions between each station lead to a relatively large calculation of the number of cycles analyzed by the RFCM. In order to study the internal stress action mechanism of IGBT modules in converter systems, the use of finite element simulation is an accepted method [18,19]. Ref.…”
Section: Introductionmentioning
confidence: 99%
“…The finite element analysis is to solve the constraint relationship between physical formulas, then decompose a realistic three-dimensional model into small units, and solve the solution of each unit to solve the solution of the whole model [20]. The literature confirms that finite element analysis can accurately reflect the heat and thermal stress generated in the operation of IGBT devices, also can help us to understand the relationship between these parameters [21], [22]. However, it is often difficult to obtain actual IGBT operating parameters, and the extraction of physical parameters requires a large amount of financial and material resources [23].…”
Section: Introductionmentioning
confidence: 99%