“…The fluctuations arising out of electric field induced defect migration and/or metastability of phases [2,3], influence the electrical, magnetic, and optical properties significantly [4]. Several authors have already reported influence of electromigration on electrical properties in both metallic and oxide nanosized systems and have resorted to measurements such as relaxation of the conductivity, noise spectra [5], to even direct imaging of defect migration by transmission electron, scanning tunneling or atomic force microscopy [6,7,8]. While electromigration of defects in nanoscale interconnects or thin film surfaces leads to destabilization and even failure, it can also train the sample by healing the stress developed otherwise [9].…”