1993
DOI: 10.1051/jp3:1993253
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Real-time optical monitoring of spin coating

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Cited by 32 publications
(34 citation statements)
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“…Optospinigraphy [11] allows real-time thickness monitoring through successive reflectance extrema, whose distance is associated with a quarter of a wavelength. Light from a laser diode (λ o 660 nm) is used in the interferometer, which is coupled to the spinner and generates for the reflectance, R, a sinusoidal profile as the fluid film flows outward in the disk, in accordance with R Rcos δ;…”
Section: Methodsmentioning
confidence: 99%
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“…Optospinigraphy [11] allows real-time thickness monitoring through successive reflectance extrema, whose distance is associated with a quarter of a wavelength. Light from a laser diode (λ o 660 nm) is used in the interferometer, which is coupled to the spinner and generates for the reflectance, R, a sinusoidal profile as the fluid film flows outward in the disk, in accordance with R Rcos δ;…”
Section: Methodsmentioning
confidence: 99%
“…As the dimension of the thickness must be h m, the spatial solution has the dimension R m l−1∕l1 according to Eq. (11).…”
Section: Theorymentioning
confidence: 99%
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“…These are influenced by other parameters such as substrate or belt thickness variations and present a typical uncertainty of Ϯ2 m [3]. Optical monitoring, on the other hand, has been used through transmission or reflection interferometry for solid thin films under vacuum deposition since the 1950s [4], whereas its application to spin coating of liquid films is more recent [5].…”
Section: Introductionmentioning
confidence: 99%
“…1,2 Application of laser interferometry to monitor spin coating of liquid films, optospinography, started in the last decade and has successfully shown the evolutionary stages of film formation at speeds of as much as 1000 rpm. [3][4][5] On the other hand, dip coating is a century-old technique and is still used largely in batch or continuous manufacturing, especially for coating nonplanar or long-dimensional objects. 6,7 Traditionally, dipcoated film thicknesses are measured by capacitive techniques with typical uncertainties of Ϯ2 m, which are also influenced by other parameters, such as substrate-or belt-thickness variations.…”
Section: Introductionmentioning
confidence: 99%