2013 Twenty-Eighth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) 2013
DOI: 10.1109/apec.2013.6520451
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Real time monitoring of aging process in power converters using the SSTDR generated impedance matrix

Abstract: A non-interfering measurement technique has been proposed in this paper to identify aging in various components in a power converter circuit. Several power MOSFETs and IGBTs were aged in a controlled environment, and spread spectrum time domain reflectometry (SSTDR) technique was applied to these components to determine the associated level of electrical degradation while they were connected in an energized circuit. Multiple impedance matrices have been created based on the measured reflection across multiple … Show more

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Cited by 8 publications
(1 citation statement)
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“…Reflectometry is a nondestructive technique to remotely detect, locate, and characterize useful information in physical systems. It has been used extensively in electrical systems to locate electrical “opens” or “shorts” [ 1 , 2 , 3 , 4 , 5 , 6 ], locate cable insulation break down [ 7 ], detect electrical system degradation [ 8 , 9 , 10 , 11 ], locate ground and arc faults [ 11 , 12 , 13 , 14 ], locate damaged components in photovoltaic (PV) systems [ 12 , 15 , 16 , 17 , 18 ], remotely measure complex impedance [ 17 , 19 , 20 , 21 , 22 ], locate intermittent faults that only occur during normal operation [ 3 , 4 , 8 , 23 , 24 , 25 , 26 ], and locate faults in three phase systems [ 27 ]. In material science, reflectometry has been used to characterize nanostructures, optical fiber networks, waveguides, and dielectrics [ 28 , 29 , 30 , 31 ].…”
Section: Reflectometrymentioning
confidence: 99%
“…Reflectometry is a nondestructive technique to remotely detect, locate, and characterize useful information in physical systems. It has been used extensively in electrical systems to locate electrical “opens” or “shorts” [ 1 , 2 , 3 , 4 , 5 , 6 ], locate cable insulation break down [ 7 ], detect electrical system degradation [ 8 , 9 , 10 , 11 ], locate ground and arc faults [ 11 , 12 , 13 , 14 ], locate damaged components in photovoltaic (PV) systems [ 12 , 15 , 16 , 17 , 18 ], remotely measure complex impedance [ 17 , 19 , 20 , 21 , 22 ], locate intermittent faults that only occur during normal operation [ 3 , 4 , 8 , 23 , 24 , 25 , 26 ], and locate faults in three phase systems [ 27 ]. In material science, reflectometry has been used to characterize nanostructures, optical fiber networks, waveguides, and dielectrics [ 28 , 29 , 30 , 31 ].…”
Section: Reflectometrymentioning
confidence: 99%