We investigated the effect of Sb-dimer-induced Si(001) relaxation on the Si 2p core level by highresolution photoemission spectroscopy. Two surface components, S ء and C ء , were identified in the Si 2p core level measured on the Sb͞Si͑001͒-͑2 3 1͒ surface at 1 monolayer Sb coverage. By using the Sb-Ge site exchange process, a Ge layer was inserted between the Sb dimers and the Si substrate to separate the Si 2p contribution arising from different atomic layers. We demonstrated that S ء includes the contribution of the first, second, and third layers, whereas only the third layer contributes to C ء .[S0031-9007(98)