Abstract:The effects of reabsorption and band-gap narrowing (BGN) on experimental photoluminescence (PL) spectra of n-InP grown by metalorganic chemical vapor deposition are analyzed. PL spectra show a pronounced widening of the main PL peak and a shift of that peak to higher photon energy with increasing doping due to band filling. However, the magnitude of these effects, both here and in earlier studies of n-type III–V semiconductors, is smaller than expected based upon band filling calculations and electrical measur… Show more
“…The discrepancy of BGN between the experimental result and the Jain theory is clearly seen at high doping level. Very similar discrepancies have been observed for n-InP [48]. Sieg and Ringel [48] have given three possible explanations in the case of n-GaAs and n-InP between the theoretical BGN calculated from Eq.…”
Section: Band Gap Shrinkage Due To Doping Effectmentioning
confidence: 59%
“…Very similar discrepancies have been observed for n-InP [48]. Sieg and Ringel [48] have given three possible explanations in the case of n-GaAs and n-InP between the theoretical BGN calculated from Eq. (10) and experimental BGN obtained by PL.…”
Section: Band Gap Shrinkage Due To Doping Effectmentioning
confidence: 60%
“…(10) giving much larger BGN values than have been observed experimentally by PL. A similar discrepancy occurs even in n-InP [48].…”
Section: Band Gap Shrinkage Due To Doping Effectmentioning
Silane (SiH 4 ) was used as an n-type dopant in GaAs grown by low pressure metalorganic vapor phase epitaxy using trimethylgallium (TMGa) and arsine (AsH 3 ) as source materials. The electron carrier concentrations and silicon (Si) incorporation efficiency are studied by using Hall effect, electrochemical capacitance voltage profiler and low temperature photoluminescence (LTPL) spectroscopy. The influence of growth parameters, such as SiH 4 mole fraction, growth temperature, TMGa and AsH 3 mole fractions on the Si incorporation efficiency have been studied. The electron concentration increases with increasing SiH 4 mole fraction, growth temperature, and decreases with increasing TMGa and AsH 3 mole fractions. The decrease in electron concentration with increasing TMGa can be explained by vacancy control model. The PL experiments were carried out as a function of electron concentration (10 17 −1.). The PL main peak shifts to higher energy and the full width at half maximum (FWHM) increases with increasing electron concentrations. We have obtained an empirical relation for FWHM of PL,. We also obtained an empirical relation for the band gap shrinkage, DE g in Si-doped GaAs as a function of electron concentration. The value of DE g (eV) = −2.75×10 − 8 n 1/3 , indicates a significant band gap shrinkage at high doping levels. These relations are considered to provide a useful tool to determine the electron concentration in Si-doped GaAs by low temperature PL measurement. The electron concentration decreases with increasing TMGa and AsH 3 mole fractions and the main peak shifts to the lower energy side. The peak shifts towards the lower energy side with increasing TMGa variation can also be explained by vacancy control model.
“…The discrepancy of BGN between the experimental result and the Jain theory is clearly seen at high doping level. Very similar discrepancies have been observed for n-InP [48]. Sieg and Ringel [48] have given three possible explanations in the case of n-GaAs and n-InP between the theoretical BGN calculated from Eq.…”
Section: Band Gap Shrinkage Due To Doping Effectmentioning
confidence: 59%
“…Very similar discrepancies have been observed for n-InP [48]. Sieg and Ringel [48] have given three possible explanations in the case of n-GaAs and n-InP between the theoretical BGN calculated from Eq. (10) and experimental BGN obtained by PL.…”
Section: Band Gap Shrinkage Due To Doping Effectmentioning
confidence: 60%
“…(10) giving much larger BGN values than have been observed experimentally by PL. A similar discrepancy occurs even in n-InP [48].…”
Section: Band Gap Shrinkage Due To Doping Effectmentioning
Silane (SiH 4 ) was used as an n-type dopant in GaAs grown by low pressure metalorganic vapor phase epitaxy using trimethylgallium (TMGa) and arsine (AsH 3 ) as source materials. The electron carrier concentrations and silicon (Si) incorporation efficiency are studied by using Hall effect, electrochemical capacitance voltage profiler and low temperature photoluminescence (LTPL) spectroscopy. The influence of growth parameters, such as SiH 4 mole fraction, growth temperature, TMGa and AsH 3 mole fractions on the Si incorporation efficiency have been studied. The electron concentration increases with increasing SiH 4 mole fraction, growth temperature, and decreases with increasing TMGa and AsH 3 mole fractions. The decrease in electron concentration with increasing TMGa can be explained by vacancy control model. The PL experiments were carried out as a function of electron concentration (10 17 −1.). The PL main peak shifts to higher energy and the full width at half maximum (FWHM) increases with increasing electron concentrations. We have obtained an empirical relation for FWHM of PL,. We also obtained an empirical relation for the band gap shrinkage, DE g in Si-doped GaAs as a function of electron concentration. The value of DE g (eV) = −2.75×10 − 8 n 1/3 , indicates a significant band gap shrinkage at high doping levels. These relations are considered to provide a useful tool to determine the electron concentration in Si-doped GaAs by low temperature PL measurement. The electron concentration decreases with increasing TMGa and AsH 3 mole fractions and the main peak shifts to the lower energy side. The peak shifts towards the lower energy side with increasing TMGa variation can also be explained by vacancy control model.
“…In addition, Fu et al [16] provide a convenient 1 m formula to determine free-electron concentration in InN films by PL measurement. The relationship between FWHM and freeelectron concentration can be well described by the empirical formula [17,18]. The free electron concentration was estimated as $7 Â 10 18 and $2 Â 10 19 cm À 3 , respectively, for the CM and PM growth of InN nanodots.…”
“…Both thermionic and tunneling currents are exponentially related to built in potential. It is found that the BGN in n-InP is higher than that of n-GaAs [120]. The BGN in AlAs and GaP are higher than that of InP, GaAs and InAs due to higher conduction band density of states and lower relative permittivity of these materials [112,121].…”
Section: Doping Issues In Iii-v Semiconductorsmentioning
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