RD53A chip susceptibility to electromagnetic conducted noise

Abstract

The RD53A read-out chip (65 nm CMOS) is a large-scale demonstrator for ATLAS and CMS phase 2 pixel upgrades. It is one of the key elements of the serial powering scheme for the next generation of pixel detectors. The susceptibility of the RD53A chip with respect to external EM noise has an impact on the integration strategies (grounding and shielding schemes) and operating conditions of future Pixel detectors. This paper presents a detailed analysis of the RD53A chip susceptibility to RF conducted disturbances in order to understand and address noise issues of RD53A Chip before the pixel upgrade installation.

Serial Powering for the Tracker Phase-2 Upgrade

“…In the past, extensive tests have been done with single RD53A chips and dedicated Shunt-LDO test chips, which demonstrated the robustness and reliability on a chip level [5]. At the same time, CMS specific developments have been ongoing and a first prototype module that hosts four RD53A chips has been designed [6].…”