Rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se2 thin solar cell film using laser-induced breakdown spectroscopy

In, Jung-Hwan; Kim, Chan-Kyu; Lee, Seok-Hee; Choi, Jang-Hee; Jeong, Sungho

doi:10.1016/j.tsf.2015.02.061

Cited by 20 publications

(7 citation statements)

References 9 publications

(16 reference statements)

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“…In addition, as another rapid depth profile analysis technique, laser‐induced breakdown spectroscopy (LIBS), which separates a sample with a laser and analyzes elements through spectroscopy, has been reported. [ 64,65 ] For D‐SIMS measurements, an ion beam is used to etch the film surface, and the ions that are produced are passed through a mass spectrometer to determine the concentration of the components. In AES, the atomic composition is estimated based on the orbital energy of the atoms originating from Auger electron emissions generated by the inter‐ and intrastate electron transitions from higher energy levels.…”

Section: Characterization Of Crystal Ordering Morphology and Compositionmentioning

confidence: 99%

Toward Understanding Chalcopyrite Solar Cells via Advanced Characterization Techniques

Bae

Kim

Lee

et al. 2022

Adv Materials Inter

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Figure 3. a) Schematic of a SAXS transmission geometry, with q i and q f denoting the incident and scattered beam wave vector, respectively. b) SEM and STEM cross-sectional images; reproduced with permission. [17] Copyright 2020, Wiley-VCH and c) SAXS profiles for U-CIGS, BK-CIGS, and SK-CIGS films. The dotted arrows denote the peak positions of the SAXS profiles at which the domain spacing is estimated. Reproduced with permission. [17]

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Section: Characterization Of Crystal Ordering Morphology and Compositionmentioning

confidence: 99%

Toward Understanding Chalcopyrite Solar Cells via Advanced Characterization Techniques

Bae

Kim

Lee

et al. 2022

Adv Materials Inter

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“…Kim et al 67,68 compared LIBS thin lm and bulk analysis of CuIn 1Àx Ga x Se 2 , studying the inuence of wavelength on LIBS measurement of thin lm CIGS. In et al [69][70][71][72] focused their research on the improvement of selenium analysis and reproducibility of LIBS measurements of CIGS cells with the uctuation of the experimental parameters and applied selfabsorption normalization to improve the reliability of the LIBS results; the conclusion of their work is that LIBS can be a viable technique for rapid quantitative analysis and depth proling of CIGS thin solar cell lms.…”

Section: Energy Industrymentioning

confidence: 99%

Industrial applications of laser-induced breakdown spectroscopy: a review

et al. 2020

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“…9 However, due to the ablation depth being typically larger than several hundreds of nanometers, accurate LIBS analyses based on calibration with standard samples were limited to films of thickness ≥ 1 µm. 10 To overcome the difficulties due to calibration, thin films were analyzed via calibration-free LIBS methods. [11][12][13] These techniques are based on modeling of the emission spectrum of the laser-produced plasma.…”

Section: Analysis Of Multielemental Thin Films Via Calibration-free Lmentioning

confidence: 99%

Analysis of Multi-elemental Thin Films via Calibration-Free Laser-Induced Breakdown Spectroscopy

et al. 2019

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Elemental analyses of thin films with complex composition are challenging as the standard analytical techniques based on measurement calibration are difficult to apply. We show that calibration-free laser-induced breakdown spectroscopy (LIBS) presents a powerful solution, enabling quantitative analyses of multielemental thin films with analytical performances better than those obtained with other techniques. The demonstration is given for a nickelchromium-molybdenum alloy film of 150 nm thickness that was produced by pulsed laser deposition. The LIBS spectra were recorded in experimental conditions that enable simple and accurate modeling of plasma emission. Thus, a calibration-free approach based on the calculation of the spectral radiance of a uniform plasma in local thermodynamic equilibrium was applied to deduce the elemental composition. Supported by analyses via Rutherford backscattering spectrometry and energy-dispersive Xray spectroscopy, the LIBS measurements evidence nonstoichiometric mass transfer of the alloy during the thin film deposition process.

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Rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se2 thin solar cell film using laser-induced breakdown spectroscopy

Cited by 20 publications

References 9 publications

Toward Understanding Chalcopyrite Solar Cells via Advanced Characterization Techniques

Toward Understanding Chalcopyrite Solar Cells via Advanced Characterization Techniques

Industrial applications of laser-induced breakdown spectroscopy: a review

Analysis of Multi-elemental Thin Films via Calibration-Free Laser-Induced Breakdown Spectroscopy

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