Rapid preparation of robust pressed powder briquettes containing a styrene and wax mixture as binder

Abstract

The binder is composed of nine parts (by mass) styrene copolymer and one part wax. Both ingredieuts are marketed under brand names and are available as 10 p.m powders, which can be conveniently blended in bulk. Exceptionally robust briquettes contahing 10% binder have been made from a great variety of sample types, including metal powders, ion exchange resins, coal, charcoal, graphite, ash, vegetable matter and geological materials. Normally the sample and binder are milled together in a swing miU and milling behaviour is not adversely allected. The briquettes are not affected by vacuum, radiation or age. Erratic milling efficiency of the six-vessel swing mills used and modifications to overcome the problem are described. For the most satisfactory ejection of a briquette, the cylinder wall of the die should taper slightly outwards near the ejecting end. A pressure of at least 0.04MPa is recommended to ensure maximum x-ray fluorescence intensity, but higher pressures improve briquette strength. In the above-mentioned laboratory 0.23 MPa is normally used. The time the briquette is held under full load is not important. The simplicity of the method makes it possible to mill and press more than 1000 briquettes per day. Binder cost is approximately 3 cents per gram.

Chemical Characterisation of Geological Raw Materials Used in Traditional Ceramics

“…-Determination of the remaining elements. Silicon, Al, Fe, Ca, Mg, Na, K, Ti, Zr, Hf, P, Sr, As, Mn, S and Cl were determined by XRF (Baker 1982, van Zyl 1982, Hickson and Juras 1986, Rouseau and Bouchard 1986, Anderson 1987, King and Vivit 1988, Feret 1990, Gazulla et al 1991, Conture et al 1993, Buhrke et al 1998, Obenauf 2002).…”

“…Silicon, Al, Fe, Ca, Mg, Na, K, Ti, Zr, Hf, P, Sr, As, Mn, S and Cl were determined by XRF (Baker 1982, van Zyl 1982, Hickson and Juras 1986, Rouseau and Bouchard 1986, Anderson 1987, King and Vivit 1988, Feret 1990, Gazulla et al 1991, Conture et al 1993, Buhrke et al 1998, Obenauf 2002). Silicon, Al, Fe, Ca, Mg, Na, K, Ti, Zr, Hf, P, Sr, As, Mn, S and Cl were determined by XRF (Baker 1982, van Zyl 1982, Hickson and Juras 1986, Rouseau and Bouchard 1986, Anderson 1987, King and Vivit 1988, Feret 1990, Gazulla et al 1991, Conture et al 1993, Buhrke et al 1998, Obenauf 2002).…”

“…In the case of Cl, sample preparation was in the form of pellets (van Zyl 1982, Hickson and Juras 1986, Anderson 1987, King and Vivit 1988, because in bead preparation, Cl would volatilise due to the high temperatures involved and high Cl volatility. The XRF measurement conditions used for Cl are given in Table 2.…”