2022
DOI: 10.1364/oe.454863
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Rapid aberration correction for diffractive X-ray optics by additive manufacturing

Abstract: Diffraction-limited hard X-ray optics are key components for high-resolution microscopy, in particular for upcoming synchrotron radiation sources with ultra-low emittance. Diffractive optics like multilayer Laue lenses (MLL) have the potential to reach unprecedented numerical apertures (NA) when used in a crossed geometry of two one-dimensionally focusing lenses. However, minuscule fluctuations in the manufacturing process and technical limitations for high NA X-ray lenses can prevent a diffraction-limited per… Show more

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Cited by 10 publications
(14 citation statements)
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“…This work was recently published in Ref. 16. The optics were used in the Ptychographic Nano-Analytical Microscope (PtyNAMi) at beamline P06 of PETRA III at DESY in Hamburg, Germany.…”
Section: Aberration Correction For Nanofocusingmentioning
confidence: 99%
See 4 more Smart Citations
“…This work was recently published in Ref. 16. The optics were used in the Ptychographic Nano-Analytical Microscope (PtyNAMi) at beamline P06 of PETRA III at DESY in Hamburg, Germany.…”
Section: Aberration Correction For Nanofocusingmentioning
confidence: 99%
“…More details about the focus can be found in Ref. 16. This aberration-correction scheme has a short implementation time.…”
Section: Aberration Correction For Nanofocusingmentioning
confidence: 99%
See 3 more Smart Citations