1984
DOI: 10.1109/tc.1984.5009315
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Random Pattern Testability

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Cited by 211 publications
(67 citation statements)
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“…Signal probabilities are used for computing average switching activity in low-power optimization [106]. They are also used in testing [109] and probabilistic verification [110]. We start by presenting a theorem which is used to generate the local NPN-based transformations.…”
Section: Chapter 5 a Greedy Local Transformation-based Methodsmentioning
confidence: 99%
“…Signal probabilities are used for computing average switching activity in low-power optimization [106]. They are also used in testing [109] and probabilistic verification [110]. We start by presenting a theorem which is used to generate the local NPN-based transformations.…”
Section: Chapter 5 a Greedy Local Transformation-based Methodsmentioning
confidence: 99%
“…Some of the commonly used ATPG algorithms like D-algorithm [31], PODEM (path-oriented decision making) algorithm [32] and FAN (fanout-oriented test generation) algorithm [33] are deterministic in nature. There are some partially probabilistic ATPG algorithms [34], [35], [36] which are basically used to reduce the input pattern search space. In order to handle transient errors occurring in intermediate gates of a circuit, we need a completely probabilistic model [37].…”
Section: A State-of-the-artmentioning
confidence: 99%
“…Aspects such as signal correlations of reconvergent paths must be taken into account. Algorithmic details for such analysis were first fleshed out by the testing community [5]. They have also found mainstream application for tasks such as timing and power analysis [6], [7].…”
mentioning
confidence: 99%