2008
DOI: 10.1002/adma.200702024
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Random Circuit Breaker Network Model for Unipolar Resistance Switching

Abstract: The random circuit breaker network model is proposed for unipolar resistance switching behavior. This model describes reversible dynamic processes involving two quasi‐metastable states. The formation and rupture of conducting channels (see figure) in the polycrystalline TiO2 thin films may be analyzed by the self organized avalanche process in the random circuit breaker network model.

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Cited by 336 publications
(208 citation statements)
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“…Due to the lack of integration of time and thermal parameters, the existing RCB models [5,6,7,11] are quite insufficient to emulate the evolution dynamics of filament under pulsing during the set transition, rendering a significant degeneration of the model accuracy. To improve the RCB model accuracy and expand the applications of the original RCB model, this paper integrates the time and thermal variables into the optimized model by introducing the thermal-driven switching rule and equivalent thermal circuits.…”
Section: Introductionmentioning
confidence: 99%
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“…Due to the lack of integration of time and thermal parameters, the existing RCB models [5,6,7,11] are quite insufficient to emulate the evolution dynamics of filament under pulsing during the set transition, rendering a significant degeneration of the model accuracy. To improve the RCB model accuracy and expand the applications of the original RCB model, this paper integrates the time and thermal variables into the optimized model by introducing the thermal-driven switching rule and equivalent thermal circuits.…”
Section: Introductionmentioning
confidence: 99%
“…Although the underlying physical mechanism for the resistive change is still under debate, the formation and rupture of conductive filaments composed of oxygen vacancies and/or metal precipitates are widely acknowledged to be responsible for the resistive switching dynamics [2,4]. In order to explore the filament formation/ rupture characteristics, several filamentary models have been proposed [5,6,7]. Among them, a random circuit breaker (RCB) model [5] was proposed to explain the reversible resistive switching (RS) in the TiO 2 based RRAM and have demonstrated its validity on explaining the RS phenomena, e.g.…”
Section: Introductionmentioning
confidence: 99%
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