1967
DOI: 10.1103/physrev.155.712
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Raman Scattering by Silicon and Germanium

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Cited by 575 publications
(343 citation statements)
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“…This result indicates that SiNS-650 had a higher crystallinity than commercial SiNPs. 22 Furthermore, the mesoporous structure of SiNS-650 was confirmed from its nitrogen adsorption-desorption isotherms (Figure 2g). Its hysteresis loop showed a typical type-IV isotherm, 23 indicating that mesopores were present within SiNS-650.…”
Section: Resultsmentioning
confidence: 77%
“…This result indicates that SiNS-650 had a higher crystallinity than commercial SiNPs. 22 Furthermore, the mesoporous structure of SiNS-650 was confirmed from its nitrogen adsorption-desorption isotherms (Figure 2g). Its hysteresis loop showed a typical type-IV isotherm, 23 indicating that mesopores were present within SiNS-650.…”
Section: Resultsmentioning
confidence: 77%
“…Figure 7a shows a µ-Raman spectrum of SLG/Ge/Si-tip heterostructure (see an illustration image in inset) using a 514 nm laser. It can be observed that besides the Si-(~520 cm -1 and the second order ~960 cm -1 ) 52 , Ge-18 cm -3 and Ge can be considered as intrinsic due to the absence of extended defects, which have an acceptor-like nature in Ge 56-57 . To illustrate the photovoltaic characteristics, Figure 7c shows a thermal equilibrium energy band diagram of the SLG/Ge/Si-tip photodetector under illumination at zero bias.…”
Section: Resultsmentioning
confidence: 99%
“…Analysis of Raman spectra was also done on RGO deposited on silicon TMBS diode structure. From the analysis, there are first-order and second order scattering of Raman spectra at ~520 and ~950 cm -1 representing the existence of single-crystal silicon (Parker 1967). A weak and broad 2D peak at 2680 cm -1 is also observed in the analysis, which another indication of disorder.…”
Section: Analysis Of Graphene Materials Using Raman Spectroscopymentioning
confidence: 81%