Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations

Self Cite

A system-level total ionizing dose test method of satellite subsystems is discussed in the context of the radiation qualification of a satellite. System-level tests are performed with high-energy X-rays, and the irradiation results of the key subsystems, including the on-board computer, attitude- and orbit-control-system computer, and battery management system, are presented and analyzed in terms of the repeatability of the results, the observability issues, and the importance of the test conditions. Furthermore, the main benefits of the system-level total ionizing dose tests of the given subsystems are discussed, as well as the risks related to performing tests at the system level.

Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study

Rajkowski,

Pustułka,

Bieda

et al. 2023

Self Cite

“…Hence, due to their importance, test methodologies evolved over the years to accommodate the growing complexity of the devices and achieve assertive results. Experimental tests using particle accelerators became a standard step towards reliable electronics, in which developers expose their systems and fault mitigation strategies to radiation using representative fault stimuli [6]. Depending on complexity and requirements, these systems are approached differently to achieve more feasibility during the development process, ranging from simple pass/fail tests to more robust analyses with the investigation of underlying phenomena [7].…”

Section: Introductionmentioning

confidence: 99%

Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring

Mattos,

Santos,

Luza

et al. 2024

Ionizing radiation induces the degradation of electronic systems. For memory devices, this phenomenon is often observed as the corruption of the stored data and, in some cases, the occurrence of sudden increases in current consumption during the operation. In this work, we propose enhanced experimental instrumentation to perform in-depth Single-Event Effects (SEE) monitoring and analysis of electronic systems. In particular, we focus on the Single-Event Latch-up (SEL) phenomena in memory devices, in which current monitoring and control are required for testing. To expose the features and function of the proposed instrumentation, we present results for a case study of an SRAM memory that has been used on-board PROBA-V ESA satellite. For this study, we performed experimental campaigns in two different irradiation facilities with protons and heavy ions, demonstrating the instrumentation capabilities, such as synchronization, high sampling rate, fast response time, and flexibility. Using this instrumentation, we could report the cross section for the observed SEEs and further investigate their correlation with the observed current behavior. Notably, it allowed us to identify that 95% of Single-Event Functional Interrupts (SEFIs) were triggered during SEL events.

“…It is shown that, due to internal compensation in the system, the complete system can be fully functional at a TID level more than two times higher than the qualification level obtained using a standardbased component-level approach. In continuation of this research, article [10] discusses the opportunities and limitations of radiation qualification by means of system-level testing. To this end, TID and SEE tests are performed and analysed on a system-in-package (SIP) PoL converter.…”

mentioning

confidence: 99%

Radiation-Tolerant Electronics

Leroux¹

2022