Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring
André M. P. Mattos,
Douglas A. Santos,
Lucas M. Luza
et al.
Abstract:Ionizing radiation induces the degradation of electronic systems. For memory devices, this phenomenon is often observed as the corruption of the stored data and, in some cases, the occurrence of sudden increases in current consumption during the operation. In this work, we propose enhanced experimental instrumentation to perform in-depth Single-Event Effects (SEE) monitoring and analysis of electronic systems. In particular, we focus on the Single-Event Latch-up (SEL) phenomena in memory devices, in which curr… Show more
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