Flash Memories 2011
DOI: 10.5772/23607
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Radiation Hardness of Flash and Nanoparticle Memories

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Cited by 3 publications
(1 citation statement)
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“…Further studies on the radiation hardness characteristics of FG Flash memories have been published, e.g. [23,24], and it is known that at a feature size of 30 nm, an ECC capable of correcting at least 24 bit errors must be used for MLC (multi-level cell) NAND Flash memory technology [25].…”
Section: Discussion Of Resultsmentioning
confidence: 99%
“…Further studies on the radiation hardness characteristics of FG Flash memories have been published, e.g. [23,24], and it is known that at a feature size of 30 nm, an ECC capable of correcting at least 24 bit errors must be used for MLC (multi-level cell) NAND Flash memory technology [25].…”
Section: Discussion Of Resultsmentioning
confidence: 99%