1988
DOI: 10.1016/0168-9002(88)90008-3
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Radiation damage in PIN-photodiodes

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Cited by 11 publications
(6 citation statements)
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“…The photodiode's re sponse de pends on the energy of the ra dio ac tive source [8]. A num ber of in ves tiga tions have dem on strated that the en ergy de pend ence is most pro nounced for en er gies be low 200 keV [9,10]. For that rea son, the PIN photodiodes should be en ergy compensated when used in low en ergy range.…”
Section: Basic Principlesmentioning
confidence: 99%
See 1 more Smart Citation
“…The photodiode's re sponse de pends on the energy of the ra dio ac tive source [8]. A num ber of in ves tiga tions have dem on strated that the en ergy de pend ence is most pro nounced for en er gies be low 200 keV [9,10]. For that rea son, the PIN photodiodes should be en ergy compensated when used in low en ergy range.…”
Section: Basic Principlesmentioning
confidence: 99%
“…The main fac tors con trib ut ing to the ra di ation in duced dam ages in PIN photodiodes are the absorbed dose and the en ergy of the ra dio ac tive source. If the PIN photodiode is ex posed to high doses and/or high en ergy ra dio ac tive sources, the struc tural damages of the sil i con crys tal line lat tice are in duced, result ing in the in crease of the dark (leak age) cur rent [4,[8][9][10]. In ad di tion, the ra di a tion in duced dam ages lead to the grad ual de crease of the level of ra di a tion induced photocurrent, i. e. de crease of the PIN photodiode's sen si tiv ity.…”
Section: Basic Principlesmentioning
confidence: 99%
“…This circuit was successfully tested up to 2 ⋅ 10 8 rad (Refs. [4][5][6]. The threshold of the following comparator can be adjusted individually for each channel by potentiometers.…”
Section: The Amplifiermentioning
confidence: 99%
“…No entanto, a maior restrição ao uso de diodo de Si na dosimetria de elétrons refere-se à queda de sensibilidade com o aumento da dose em consequência dos danos provocados por este tipo de radiação [18,19]. Estes danos comprometem as condições operacionais do diodo devido, principalmente, ao aumento da corrente de fuga e da tensão de depleção total do dispositivo e a redução da eficiência de coleta de carga nos eletrodos do detector [20][21][22][23][24][25][26][27][28][29].…”
Section: Introductionunclassified