“…On the other hand, particle detector for focused heavy ion microbeam is now under development at the Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency (TARRI/JAEA). It requires durable, sensitive particle detectors especially for individual heavy ion irradiation experiment of 260 MeV Ne, 520 MeV Ar, or 220 MeV C from the azimuthally varying field (AVF) cyclotron accelerator [8,9]. In-situ detection techniques for these heavy ions were required for the precise evaluation of the single-hit experiments used for single living-cell irradiation [10,11], surface modification of polymers [12,13], and testing semiconductor devices [14,15].…”