2009
DOI: 10.1063/1.3249560
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Quartz crystal microbalance-based system for high-sensitivity differential sputter yield measurements

Abstract: We present a quartz crystal microbalance-based system for high sensitivity differential sputter yield measurements of different target materials due to ion bombardment. The differential sputter yields can be integrated to find total yields. Possible ion beam conditions include ion energies in the range of 30-350 eV and incidence angles of 0 degrees-70 degrees from normal. A four-grid ion optics system is used to achieve a collimated ion beam at low energy (<100 eV) and a two-grid ion optics is used for higher … Show more

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Cited by 11 publications
(5 citation statements)
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“…A dc Kaufman ion source using a dual thoriated tungsten filament as a discharge cathode and thoriated tungsten filament as a neutralizer is used [11]. The four-grid ion optics system, designed using an in-house ffx code [26,27] and fabricated in-house, produces collimated beams at the low ion energies of interest to this work (20-350 eV). For higher energy measurements (250-500 eV), a two-grid ion optics system is used.…”
Section: Ion Sourcementioning
confidence: 99%
See 1 more Smart Citation
“…A dc Kaufman ion source using a dual thoriated tungsten filament as a discharge cathode and thoriated tungsten filament as a neutralizer is used [11]. The four-grid ion optics system, designed using an in-house ffx code [26,27] and fabricated in-house, produces collimated beams at the low ion energies of interest to this work (20-350 eV). For higher energy measurements (250-500 eV), a two-grid ion optics system is used.…”
Section: Ion Sourcementioning
confidence: 99%
“…Ion source characterization was performed to determine the bombardment conditions [26]. The beam divergence angle, defined as the angle from the normal including 90% of the beam current, was found as 12 • from a beam profile measured with a collimated Faraday probe (the divergence angle increases slightly with beam energy), corresponding to a beam diameter of approximately 13.5 cm at the sample plane.…”
Section: Ion Sourcementioning
confidence: 99%
“…Moreover, a temperature calibration and sufficient cooling of the QCM sensor is needed with regard to the significant heating observed. The latter is likely to cause frequency instabilities and influence the sticking coefficient and is most commonly induced by bombarding ions when operating a QCM in a sputtering setup 27 . Therefore, not only the quantitative but also the energetic distribution of sputtered particles would be of interest here.…”
Section: Discussionmentioning
confidence: 99%
“…The simplest approach to measuring channel wall erosion rate is to run the thruster for a set number of hours and measure the channel wall profile via profilometry. 1,2 Other potential channel erosion diagnostics include quartz crystal microbalance 3,4 and emission spectroscopy. 3,5 Weight loss is also regularly used to measure sputter yield.…”
Section: Introductionmentioning
confidence: 99%