2009
DOI: 10.1557/proc-1184-hh01-06
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Quantitative Scanning Transmission Electron Microscopy for the Measurement of Thicknesses and Volumes of Individual Nanoparticles

Abstract: In Scanning Transmission Electron Microscopy (STEM) the High-Angle Annular Dark-Field (HAADF) signal increases with atomic number and sample thickness, while dynamic scattering effects and sample orientation have little influence on the contrast. The sensitivity of the HAADF detector for a FEI F30 transmission electron microscope has been calibrated. Additionally, a nearly linear relationship of the HAADF signal with the incident electron current is confirmed. Cross sections of multilayered samples for contras… Show more

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“…Evaluation of the NP size, volume and distribution on the surface has been carried out in the past using HAADF images (Prestridge et al, 1977;Sanders, 1986;Menard et al, 2006aMenard et al, , 2006bHeinrich et al, 2009). A representative plan-view HAADF-STEM image of an Au deposited sample from reduction by NaBH 4 is shown in Figure 5.…”
Section: Quantitative Analysis Of Haadf-stem Imagesmentioning
confidence: 99%
“…Evaluation of the NP size, volume and distribution on the surface has been carried out in the past using HAADF images (Prestridge et al, 1977;Sanders, 1986;Menard et al, 2006aMenard et al, , 2006bHeinrich et al, 2009). A representative plan-view HAADF-STEM image of an Au deposited sample from reduction by NaBH 4 is shown in Figure 5.…”
Section: Quantitative Analysis Of Haadf-stem Imagesmentioning
confidence: 99%