2004
DOI: 10.1016/j.electacta.2003.12.029
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Quantitative Ohmic model for transient growths of passivating films

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Cited by 9 publications
(14 citation statements)
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“…At the same time, the representation of ρf vs. charge density of the film presents a minimum. This behavior was also found by other authors in the cases of Zn, Nb, Ni and galvanized steel sheets [12][13][14][15][16][17].…”
Section: Introductionsupporting
confidence: 66%
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“…At the same time, the representation of ρf vs. charge density of the film presents a minimum. This behavior was also found by other authors in the cases of Zn, Nb, Ni and galvanized steel sheets [12][13][14][15][16][17].…”
Section: Introductionsupporting
confidence: 66%
“…This result shows that the charge required for film growth up to peak potential becomes constant for sweep rates higher than 0.10 V s -1 . According to D'Alkaine [13] this means that the parameters related to the film (aging phenomenon) become independent of the growing conditions for sweep rates higher than 0.10 V s -1 . In view of this fact, the variable ionic resistivities were studied for 2 and 100 mV s -1 .…”
Section: Resultsmentioning
confidence: 99%
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“…15 A espessura da película (camada depositada) e suas propriedades dependem de diversos fatores: densidade da corrente aplicada, concentração dos sais, temperatura do banho, presença de aditivos, natureza do metal de base, agitação do banho, pH etc. 12,13,16 A quantidade de metal eletrodepositado determina a massa e as dimensões finais das peças tratadas. Por isso, a quantidade de depósito tem que ser controlada dentro de tolerâncias muito restritas para que a peça final esteja dentro de suas especificações.…”
Section: Introductionunclassified