Quantitative nanofriction characterization of corrugated surfaces by atomic force microscopy

Podestà, Alessandro; Fantoni, G.; Milani, Paolo

doi:10.1063/1.1710692

Cited by 10 publications

(6 citation statements)

References 48 publications

(70 reference statements)

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“…The effective friction coefficient, l, was extracted from the slope of a line fit. This linear behavior between the friction force and the applied load is expected for a multi-asperity contact regime [9,23] and was also observed experimentally for a contact between a spherical particle and the sample surface [12].…”

Section: Resultssupporting

confidence: 76%

Frictional Properties of a Mesoscopic Contact with Engineered Surface Roughness

2011

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Friction between titanium spheres and an artificially structured silicon surface was measured with a friction force microscope. Two spheres with radii of 2.3 lm and 7.9 lm were firmly glued to the tip of the microscope cantilever. A periodic stripe pattern with a groove depth of 26 nm and systematically increasing groove width from 500 nm to 3500 nm was fabricated from a silicon wafer with a focused ion beam. The sphere substrate friction coefficient shows a strong enhancement at a certain groove periodicity, which is related to geometrical interlocking of the two surfaces. This shows that careful modification of the surface roughness can help to control the tribological behavior of mesoscale contacts.

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Section: Resultssupporting

confidence: 76%

Frictional Properties of a Mesoscopic Contact with Engineered Surface Roughness

2011

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“…Individual lateral force signals (trace and retrace) may be convoluted with topography information. In addition, they contain signals due to electronic noise, laser intensity fluctuations, laser interference, environmental changes (temperature and relative humidity), and other cross-talks effects. − These signals that all contribute to the lateral signal may vary from scan line to scan line and may depend on load. By subtracting the corresponding trace and retrace lateral signals, the impact of the factors is canceled in most cases in the difference friction signal.…”

Section: Resultsmentioning

confidence: 99%

Quantitative Nanotribology by AFM: A Novel Universal Calibration Platform

2006

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The quantitative determination of friction forces by atomic force microscopy (AFM) in nanotribology requires the conversion of the output voltage signal of the sector area-sensitive photodiode to force using (a) the torsional spring constant of the cantilever and (b) the lateral sensitivity of the photodiode. Many existing methods provide calibration factors with large errors and suffer from poor reproducibility. We report on the fabrication, validation, and application of a new, universally applicable standard specimen that enables one to accurately calibrate all types of AFM cantilevers and tips for quantitative friction force measurements. The Si(100) calibration standard, which exhibits 30 and 50 mum wide notches with tilt angles theta between 20 degrees and 35 degrees with respect to the wafer surface, was fabricated by focused ion beam (FIB) milling. The quantification of friction forces obtained on this universal standard specimen using a direct method (the improved wedge calibration method, as introduced by Ogletree, Carpick, and Salmeron Rev. Sci. Instrum. 1996, 67, 3298-3306), which yields (a) and (b) simultaneously, was critically tested for various types of Si3N4 integrated cantilever-tip assemblies. The error in the calibration factors obtained was found to be ca. 5%, which is a significant improvement compared to errors of 30-50% observed for the often applied two-step calibration procedures of cantilever lateral force constant and photodiode sensitivity. As demonstrated for oxidized Si(100), thin films of poly(methyl methacrylate) (PMMA), and micropatterned self-assembled monolayers (SAMs) on gold, the calibration of various V-shaped and single beam cantilevers based on the application of the new universal standard in conjunction with the direct wedge method proposed allows one to conveniently perform quantitative nanotribological measurements for a wide range of materials and applications.

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“…11, T − in RETR has the same sign as T + in TR. This is because the tip is deflected to the same side in both cases.…”

Section: Methodsmentioning

confidence: 90%

“…Similar to the approach reported by Podestà et al, 11 a set of equations can be obtained from this force configuration from which the coefficient of friction between the tip and the surface sample can be derived. We outline this approach in the following, assuming that the cantilever does not bend significantly.…”

Section: Methodsmentioning

confidence: 96%

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Novel method for measuring nanofriction by atomic force microscope

Salvadori

Lisboa

Fernandes

et al. 2008

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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The authors describe a novel approach to the measurement of nanofriction, and demonstrate the application of the method by measurement of the coefficient of friction for diamondlike carbon ͑DLC͒ on DLC, Si on DLC, and Si on Si surfaces. The technique employs an atomic force microscope in a mode in which the tip moves only in the z ͑vertical͒ direction and the sample surface is sloped. As the tip moves vertically on the sloped surface, lateral tip slipping occurs, allowing the cantilever vertical deflection and the frictional ͑lateral͒ force to be monitored as a function of tip vertical deflection. The advantage of the approach is that cantilever calibration to obtain its spring constants is not necessary. Using this method, the authors have measured friction coefficients, for load range 0 Ͻ L Ͻ 6 N, of 0.047Ϯ 0.002 for Si on Si, 0.0173Ϯ 0.0009 for Si on DLC, and 0.0080Ϯ 0.0005 for DLC on DLC. For load range 9 Ͻ L Ͻ 13 N, the DLC on DLC coefficient of friction increased to 0.051Ϯ 0.003.

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Quantitative nanofriction characterization of corrugated surfaces by atomic force microscopy

Cited by 10 publications

References 48 publications

Frictional Properties of a Mesoscopic Contact with Engineered Surface Roughness

Frictional Properties of a Mesoscopic Contact with Engineered Surface Roughness

Quantitative Nanotribology by AFM: A Novel Universal Calibration Platform

Novel method for measuring nanofriction by atomic force microscope

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