Quantitative material characterization by ultrasonic AFM

Yamanaka, Kazushi; Noguchi, A.; Tsuji, Toshihiro; Koike, Taichi; Goto, Takuo

doi:10.1002/(sici)1096-9918(199905/06)27:5/6<600::aid-sia508>3.0.co;2-w

Cited by 135 publications

(70 citation statements)

References 15 publications

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“…This shift can either be used to measure quantitatively the local contact stiffness or to image variation in elastic properties. [6][7][8][9][10][11][12] By insonifying ultrasonic shear waves into the sample causing in-plane surface displacements, torsional resonances of the AFM cantilevers were excited, offering the possibility to gain information on frictional properties or shear elasticity. 2 Using a scanning interferometer, 13 we examined the vibration spectra of cantilevers made of single crystal silicon with approximately rectangular shape.…”

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confidence: 99%

Imaging using lateral bending modes of atomic force microscope cantilevers

Caron

Rabe

Reinstädtler

et al. 2004

Applied Physics Letters

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Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.

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confidence: 99%

Imaging using lateral bending modes of atomic force microscope cantilevers

Caron

Rabe

Reinstädtler

et al. 2004

Applied Physics Letters

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“…The technique was first developed by Rabe and coworkers [RAB94,RAB95,RAB00] and is usually called atomic force acoustic microscopy (AFAM). A very similar method, called ultrasonic atomic force microscopy (UAFM), has been developed by Yamanaka et al [YAM96,YAM99].…”

Section: Linear Cantilever Spectroscopy Methodsmentioning

confidence: 99%

“…For clarity, we will limit the discussion to the approach used in AFAM. The specific details of the UAFM approach are somewhat different, although equally valid [YAM98,YAM99].…”

Section: Quantitative Techniquesmentioning

confidence: 99%

Ultrasonic Studies of the Fundamental Mechanisms of Recrystallization and Sintering of Metals

Turner¹

2005

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ObjectivesThe purpose of this project was to develop a fundamental understanding of the interaction of an ultrasonic wave with complex media, with specific emphases on recrystallization and sintering of metals. A combined analytical, numerical, and experimental research program was implemented. Theoretical models of elastic wave propagation through these complex materials were developed using stochastic wave field techniques. The numerical simulations focused on finite element wave propagation solutions through complex media. The experimental efforts were focused on corroboration of the models developed and on the development of new experimental techniques. The analytical and numerical research allows the experimental results to be interpreted quantitatively. Alteration in Collaborative ArrangementIn fall 2002, the Ames Lab partner, Dr. James C. Foley, announced that he was leaving for another position at Los Alamos National Laboratory. Dr. R. Bruce Thompson has served as the primary contact for this collaboration since Dr. Foley departed. Accomplishments (Recrystallization)Analytical Modeling. Expressions for the ultrasonic attenuation in media with arbitrary texture have been developed using stochastic wave propagation theory. Initial attempts at deriving simple expressions for the attenuation were unsuccessful. Therefore, a modified technique was developed that relies slightly more on numerical calculations. The method is based on a generalized function of a single scalar variable σ that characterizes the state of texture. In this case the weighting function for the individual grains is given by ( ) with θ as the grain orientation angle. Thus, when σ → 0 all grains are aligned and the material is transversely isotropic at the macroscale. As σ → ∞, all grains are randomly oriented and the material is isotropic at the macroscale.In terms of attenuation, the covariance of the microstructure is the primary quantity needed for the calculation of attenuation. It is defined by in which both Eqs. (2) and (3) include the grain orientation distribution function F such that and are dependent on σ. Example results using Eq. (2) are shown in Fig. 1 for both the average elastic properties as well as quasilongitudinal slowness surfaces in terms of σ. The transition from transversely isotropy to complete isotropy is captured well using the grain orientation distribution function. Example results for attenuation are shown in Fig. 2. Again, the transition from transverse isotropy to complete isotropy is shown. Of particular note is the peak observed in the SH attenuation when σ is about 0.5. Such information may be useful for process monitoring. (a) (b)Progress was also made in the study of multiple scattering in slab geometries. These results have applications associated with heterogeneous bonding and interface layers. Two example results are shown in Fig. 3. The layer is insonified by a plane longitudinal wave. One question in the multiple scattering regime is associated with the applicability of the diffusion li...

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“…The AFM tip is then brought in contact with the sample surface. The cantilever-tip-sample system is set into oscillation, e.g., through piezoelectric actuator coupled with the back of the sample [29] or with the cantilever chip [30,31], through Schottky barrier depletion-layer actuation [32], or through photothermal excitation [33]. The contact between the sample and the tip, the latter placed at distance L 1 from the cantilever chip being L the cantilever length, can be modeled as the parallel between a spring with elastic constant k * and a dashpot of damping σ .…”

Section: Techniquementioning

confidence: 99%

Contact resonance atomic force microscopy for viscoelastic characterization of polymer-based nanocomposites at variable temperature

Natali

Passeri

Reggente

et al. 2016

AIP Conference Proceedings

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Abstract. Characterization of mechanical properties at the nanometer scale at variable temperature is one of the main challenges in the development of polymer-based nanocomposites for application in high temperature environments. Contact resonance atomic force microscopy (CR-AFM) is a powerful technique to characterize viscoelastic properties of materials at the nanoscale. In this work, we demonstrate the capability of CR-AFM of characterizing viscoelastic properties (i.e., storage and loss moduli, as well as loss tangent) of polymer-based nanocomposites at variable temperature. CR-AFM is first illustrated on two polymeric reference samples, i.e., low-density polyethylene (LDPE) and polycarbonate (PC). Then, temperature-dependent viscoelastic properties (in terms of loss tangent) of a nanocomposite sample constituted by a epoxy resin reinforced with single-wall carbon nanotubes (SWCNTs) are investigated.

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Quantitative material characterization by ultrasonic AFM

Cited by 135 publications

References 15 publications

Imaging using lateral bending modes of atomic force microscope cantilevers

Imaging using lateral bending modes of atomic force microscope cantilevers

Ultrasonic Studies of the Fundamental Mechanisms of Recrystallization and Sintering of Metals

Contact resonance atomic force microscopy for viscoelastic characterization of polymer-based nanocomposites at variable temperature

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