2016
DOI: 10.1063/1.4954491
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Contact resonance atomic force microscopy for viscoelastic characterization of polymer-based nanocomposites at variable temperature

Abstract: Abstract. Characterization of mechanical properties at the nanometer scale at variable temperature is one of the main challenges in the development of polymer-based nanocomposites for application in high temperature environments. Contact resonance atomic force microscopy (CR-AFM) is a powerful technique to characterize viscoelastic properties of materials at the nanoscale. In this work, we demonstrate the capability of CR-AFM of characterizing viscoelastic properties (i.e., storage and loss moduli, as well as … Show more

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Cited by 11 publications
(5 citation statements)
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“…Natali et al 118 used a similar approach to characterize the temperature-dependent loss tangent of PS, PE, polycarbonate (PC), and a polymer-based nanocomposite from 25 to 70 °C. PS, PE, and PC were used as calibration samples to validate the approach over the temperature range; the resulting tan δ values agreed with data from the literature both in terms of their absolute values and their trends with temperature.…”
Section: ■ Environmental Considerationsmentioning
confidence: 99%
“…Natali et al 118 used a similar approach to characterize the temperature-dependent loss tangent of PS, PE, polycarbonate (PC), and a polymer-based nanocomposite from 25 to 70 °C. PS, PE, and PC were used as calibration samples to validate the approach over the temperature range; the resulting tan δ values agreed with data from the literature both in terms of their absolute values and their trends with temperature.…”
Section: ■ Environmental Considerationsmentioning
confidence: 99%
“…For this purpose, we acquired the values of f 1 and f 2 and the corresponding quality factors Q 1 and Q 2 on both the Ti/PMMA and the commercial bulk PMMA. The values of tanδ were then calculated as detailed elsewhere [49].…”
Section: Contact Resonance Atomic Force Microscopymentioning
confidence: 99%
“…Formerly referred to as atomic force acoustic microscopy (Rabe, Kopycinska‐Müller, & Hirsekorn, ) or ultrasonic AFM (Yamanaka & Tsuji, ), from the value of one or more CRFs, CR‐AFM allows one to quantitatively measure and map the indentation modulus of materials with elastic properties varying in a broad range, that is, from stiff crystals, ceramics (Rabe et al, ) and gemstones (Passeri et al, ), hard coatings like diamond‐like carbon (Amelio et al, ; Passeri et al, ) to soft materials like polymers (Liu et al, ) or biological samples (Ebert et al, ). Moreover, by analyzing both CRFs and their quality factors Q c , CR‐AFM enables the characterization of viscoelastic materials allowing the quantitative mapping of storage and loss moduli and loss tangent, as demonstrated on polymer blends (Chakraborty & Yablon, ; Hurley, Campbell, Killgore, Cox, & Ding, ; Killgore, Yablon, et al, ; Yablon et al, ; Yablon, Grabowski, & Chakraborty, ), polymer‐based nanocomposites reinforced with hard nanomaterials (Natali et al, ), and biological samples (Churnside, Tung, & Killgore, ). The broadness of the range of materials which can be studied makes CR‐AFM a fairly versatile technique for subsurface imaging.…”
Section: Identification Of Nanoparticles and Nanosystems In Biological Matricesmentioning
confidence: 99%