“…Formerly referred to as atomic force acoustic microscopy (Rabe, Kopycinska‐Müller, & Hirsekorn, ) or ultrasonic AFM (Yamanaka & Tsuji, ), from the value of one or more CRFs, CR‐AFM allows one to quantitatively measure and map the indentation modulus of materials with elastic properties varying in a broad range, that is, from stiff crystals, ceramics (Rabe et al, ) and gemstones (Passeri et al, ), hard coatings like diamond‐like carbon (Amelio et al, ; Passeri et al, ) to soft materials like polymers (Liu et al, ) or biological samples (Ebert et al, ). Moreover, by analyzing both CRFs and their quality factors Q c , CR‐AFM enables the characterization of viscoelastic materials allowing the quantitative mapping of storage and loss moduli and loss tangent, as demonstrated on polymer blends (Chakraborty & Yablon, ; Hurley, Campbell, Killgore, Cox, & Ding, ; Killgore, Yablon, et al, ; Yablon et al, ; Yablon, Grabowski, & Chakraborty, ), polymer‐based nanocomposites reinforced with hard nanomaterials (Natali et al, ), and biological samples (Churnside, Tung, & Killgore, ). The broadness of the range of materials which can be studied makes CR‐AFM a fairly versatile technique for subsurface imaging.…”