2013
DOI: 10.1016/j.nimb.2012.11.048
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Quantitative elemental microscopy on lateral highly inhomogeneous meteorite samples using ion beam analysis

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Cited by 3 publications
(3 citation statements)
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“…With respect to quantification, effects similar to detector dead time have to be considered for further development of the system. In particular, inhomogeneous samples including hot spots of some elements may impair the linearity of the sensitivity of the detector.…”
Section: Resultsmentioning
confidence: 99%
“…With respect to quantification, effects similar to detector dead time have to be considered for further development of the system. In particular, inhomogeneous samples including hot spots of some elements may impair the linearity of the sensitivity of the detector.…”
Section: Resultsmentioning
confidence: 99%
“…As part of an investigation into meteorite samples, Wunderlich et al . () describe a solution for correcting the lateral dead time based on a noise‐triggered pulse generator. Silicate and oxide crystals located in the close proximity of massive Fe‐Ni grains are a challenge for IBA mapping due to the strongly varying dead time of the detector electronics, leading to inaccurate quantitative PIXE and RBS maps on highly heterogeneous samples.…”
Section: Advances In Accelerator‐based Methods (Contribution By: R Bmentioning
confidence: 99%
“…Wunderlich et al . () compared the number of generated and processed pulses, thereby generating a dead‐time map that was then used to correct the collected spectrum on a pixel‐per‐pixel basis. In addition, recording the dead‐time map allowed the use of high‐beam currents providing higher counting rates and leading to a reduction in the overall measurement time.…”
Section: Advances In Accelerator‐based Methods (Contribution By: R Bmentioning
confidence: 99%