Quantitative atomic force measurement with a quartz tuning fork

Lee, Manhee; Jahng, Junghoon; Kim, Kyung-Ho; Jhe, Wonho

doi:10.1063/1.2756125

Cited by 54 publications

(48 citation statements)

References 14 publications

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“…(12) and (13), we have performed dynamic force spectroscopy using the quartz-tuning-fork -(QTF) based AM-AFM operated in the shear mode [12,26,27] (see inset of Fig. 1).…”

Section: Resultsmentioning

confidence: 99%

Shear-stress function approach of hydration layer based on the Green-Kubo formula

et al. 2015

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We present the analytic expression of the stress correlation (SC) function for the ubiquitous hydration water layer (HWL) using the Green-Kubo equation and the shear modulus of HWL. The SC function is then experimentally obtained by measuring the viscoelastic properties of HWL using shear-mode dynamic force spectroscopy. Interestingly, the SC changes sign from positive to negative as the HWL thickness increases, where the shear stresses acting on the HWLs bound to two nearby surfaces are out of phase. We also suggest that the repulsive hydration force originates from the SC of HWL. Our results provide the first demonstration of the microscopic understanding of the HWL viscoelasticity and may allow a deeper insight on the HWL dynamics as well as the complex liquids.

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“…(12) and (13), we have performed dynamic force spectroscopy using the quartz-tuning-fork -(QTF) based AM-AFM operated in the shear mode [12,26,27] (see inset of Fig. 1).…”

Section: Resultsmentioning

confidence: 99%

Shear-stress function approach of hydration layer based on the Green-Kubo formula

et al. 2015

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“…With the equation of simple harmonic motion, the interacted force can be interpreted by effective elasticity (k int ) and viscosity (b int ). [9][10][11] With this theoretical tool, we can study and interpret the mechanical properties of the fabricated objects (confined nano-water formed naturally between the nanopipette tip and the substrate) by measurement of interaction forces. Figure 3 shows the interpretations of the QTF signals which are occurred by capillary force of the confined nano-water formed between the nanopipette tip and the substrate.…”

Section: Qtf-afm System For Interpretation Of Target Materials' Mechamentioning

confidence: 99%

Optical microscope combined with the nanopipette-based quartz tuning fork-atomic force microscope for nanolithography

Stambaugh

Kwon

et al. 2013

SPIE Proceedings

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We demonstrated the optical microscope (OM) combined with nanopipette-based quartz tuning fork -atomic force microscope (QTF-AFM) for nanolithography. The nanoparticle (Au, 5 nm), nanowire, PDMS solutions are ejected onto the substrate through the nano/microaperture of the pulled pipette, and the nano/microscale objects were in-situ formed on the surface with the proposed patterning system, while the position is defined by monitoring the phenomena on the substrate with a home-made OM. After forming of capillary condensation between apex of the pipette tip and the surface, the electric field is applied to extract out the inside liquid to the substrate and the nano/microscale objects are fabricated. The nanoscale patterning size can be controlled by the aperture diameters of the pulled pipette.

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“…As the tip approaching the sample, the resonance frequency of the QTF changes through a perturbation of the nanoscale liquid meniscus. Using the equation for damped harmonic motion, the interaction force can be interpreted as an effective elasticity (k int ) and viscosity (b int ) [27]. With this theoretical tool, one can study the mechanical properties of nanoscale objects, such as a nanoscale water meniscus.…”

Section: Qtf Sensormentioning

confidence: 99%

Position-resolved Surface Characterization and Nanofabrication Using an OpticalMicroscopeCombined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope

Jhe

Sung

et al. 2014

Nano-Micro Lett

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Abstract:In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope (OM) combined with a nanopipette-based quartz tuning fork atomic force microscope (nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions. Solutions consisting of 5 nm Au nanoparticles, nanowires, and polydimethylsiloxane (PDMS) are deposited onto the substrate through the nano/microaperture of a pulled pipette. Nano/microscale patterning is performed using a nanopipette/QTF-AFM, while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization (force spectroscopy/microscopy) using the quartz tuning fork (QTF) sensor. Nanofabrication is achieved by accurately positioning target materials on the surface, and on-demand delivery and patterning of various solutions for molecular architecture.

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Quantitative atomic force measurement with a quartz tuning fork

Cited by 54 publications

References 14 publications

Shear-stress function approach of hydration layer based on the Green-Kubo formula

Shear-stress function approach of hydration layer based on the Green-Kubo formula

Optical microscope combined with the nanopipette-based quartz tuning fork-atomic force microscope for nanolithography

Position-resolved Surface Characterization and Nanofabrication Using an OpticalMicroscopeCombined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope

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