1991
DOI: 10.1366/0003702914335913
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Quantitative Analysis of Powdery Sample by Diffuse Reflectance Infrared Fourier Transform Spectrometry: Determination of the α-Component in Silicon Nitride

Abstract: An application of diffuse reflectance infrared Fourier transform (DRIFT) spectrometry to determine powdery sample with an unknown particle size has been proposed. The usefulness of this technique has been demonstrated for the analysis of the α-component in Si3N4 powders. The particle size of the α-component in Si3N4 powder could be determined by measuring the peak intensity ratio between two peaks (500 and 690 cm−1) on the DRIFT spectrum, and the concentration could be determined by comparing the peak intensit… Show more

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Cited by 30 publications
(31 citation statements)
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“…The mesoporous silica and mesoporous silicon oxynitride are X-ray amorphous, thus limiting structural characterization; however, the nature of these amorphous networks can be assessed from infrared (IR) spectroscopy studies [9,10], which can provide some information about surface species as well as bulk. There are several IR-active surface species such as silanol groups ("Si(OH)), amide ("Si(NH 2 )), and imides (or silazane) ("Si-NH-Si").…”
Section: Resultsmentioning
confidence: 99%
“…The mesoporous silica and mesoporous silicon oxynitride are X-ray amorphous, thus limiting structural characterization; however, the nature of these amorphous networks can be assessed from infrared (IR) spectroscopy studies [9,10], which can provide some information about surface species as well as bulk. There are several IR-active surface species such as silanol groups ("Si(OH)), amide ("Si(NH 2 )), and imides (or silazane) ("Si-NH-Si").…”
Section: Resultsmentioning
confidence: 99%
“…In the technique known as diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS), it is only valid for small concentrations of analyte where light scattering is limited. 38,39 Prior studies on light extinction in powders for DRIFTS applications have focused on resolving the deviations between reflectance measurements and concentration, which increase with larger absorption and nonconstant scattering. [16][17][18][19]39 In particular, determining deviations for strongly scattering samples necessitates an ability to measure the amount of light scattering.…”
Section: Introductionmentioning
confidence: 99%
“…Experimental energy gaps of QDs are often determined from diffuse reflectance spectroscopy, using the Kubelka− Munk remission function which converts reflectance to absorption edge measurements. 36,37 The nature of electronic transitions is typically deduced from the Tauc equation fits into reflectance data. 8 The energy gaps obtained in these measurements usually follow expected trends.…”
Section: ■ Introductionmentioning
confidence: 99%