2018
DOI: 10.3791/56042
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Quantifying X-Ray Fluorescence Data Using MAPS

Abstract: The quantification of X-ray fluorescence (XRF) microscopy maps by fitting the raw spectra to a known standard is crucial for evaluating chemical composition and elemental distribution within a material. Synchrotron-based XRF has become an integral characterization technique for a variety of research topics, particularly due to its non-destructive nature and its high sensitivity. Today, synchrotrons can acquire fluorescence data at spatial resolutions well below a micron, allowing for the evaluation of composit… Show more

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Cited by 23 publications
(25 citation statements)
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References 19 publications
(12 reference statements)
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“…The emitted radiation is then analyzed by either photon energy or wavelength. To determine the concentration of each element in the scanned tissue, the intensity of the characteristic radiation is compared to a known standard scanned at the beginning and end of each session (Nietzold et al, 2018). To obtain a high-resolution map of elements and their concentrations within the target tissue, an x-ray beam with a small spot size is rastered across the tissue.…”
Section: X-ray Fluorescence Microscopy (Xfm)mentioning
confidence: 99%
See 1 more Smart Citation
“…The emitted radiation is then analyzed by either photon energy or wavelength. To determine the concentration of each element in the scanned tissue, the intensity of the characteristic radiation is compared to a known standard scanned at the beginning and end of each session (Nietzold et al, 2018). To obtain a high-resolution map of elements and their concentrations within the target tissue, an x-ray beam with a small spot size is rastered across the tissue.…”
Section: X-ray Fluorescence Microscopy (Xfm)mentioning
confidence: 99%
“…Fluorescence spectra were collected with a fourelement silicon drift detector positioned at an angle of 90 to the incident x-ray beam (Vortex-EX, SII Nanotechnology, CA). Data sets were processed with MAPS software (Nietzold et al, 2018;Vogt, 2003).…”
Section: Imaging Of Samplesmentioning
confidence: 99%
“…For the analysis of halide perovskite devices, we thus emphasize within‐sample analysis and comparison of samples produced using identical processes. The quantification process for nano‐XRF as applied for thin film solar cells was recently reported in detail in a visualized experiment to facilitate use by the broader community …”
Section: Tools To Assess Nanoscale Perovskite Chemistry and Its Optoementioning
confidence: 99%
“…To collect high-sensitivity XRF measurements combined with an XBIC measurement such as in the case of figure 9, we used the step-scan mode with 1 s dwell time and200 nm 200 nm step size. From the XRF spectra of the sample and thin-film references, the elemental distributions of Cu and Ga were determined using the analysis software MAPS [23,51,52]. The XRF data were corrected for self-absorption effects, as discussed in [24], with a sensitivity analysis included as well.…”
Section: Methodsmentioning
confidence: 99%