2016
DOI: 10.1039/c6ee00462h
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Quantification of spatial inhomogeneity in perovskite solar cells by hyperspectral luminescence imaging

Abstract: Perovskite solar cells are analyzed by photo- and electroluminescence hyperspectral imaging. Significant spatial inhomogeneities in the quasi-Fermi level splitting are observed.

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Cited by 105 publications
(114 citation statements)
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“…In fact, we can extract the actual temperature by fitting the slope of the high-energy side of the PL spectrum using the absorptivity measured by a spectrophotometer (see the Experimental Details for the spectrophotometer measurement procedure). [25][26][27][28] Thus, in this study, we use the temperature of 315 K for all calculations. This is, indeed, a very well-established method employed by numerous authors to extract sample temperatures from luminescence spectra.…”
Section: Methods Descriptionmentioning
confidence: 99%
“…In fact, we can extract the actual temperature by fitting the slope of the high-energy side of the PL spectrum using the absorptivity measured by a spectrophotometer (see the Experimental Details for the spectrophotometer measurement procedure). [25][26][27][28] Thus, in this study, we use the temperature of 315 K for all calculations. This is, indeed, a very well-established method employed by numerous authors to extract sample temperatures from luminescence spectra.…”
Section: Methods Descriptionmentioning
confidence: 99%
“…While the absolute locations of E F,e and E F,h are generally not accessible, the QFLS can be determined directly by means of absolute PL measurements . This methodology has been proven to be an efficient approach for quantifying recombination losses in the neat perovskite, multilayer assemblies or even complete perovskite solar cells …”
Section: Theorymentioning
confidence: 99%
“…Hyperspectral imaging is an alternative approach which compromises between luminescence imaging and spectroscopy. The technique utilizes one physical dimension of a camera chip ( X or Y ) as a physical dimension on the sample surface ( X or Y ), and the other physical dimension of the chip as a spectral dimension to provide a luminescence spectrum for each pixel on a sample . Thus, one, in principle, can extract an optical bandgap image, which is an image of peak locations of band‐to‐band luminescence spectra, from the sample using hyperspectral imaging tools.…”
Section: Introductionmentioning
confidence: 99%