Proceedings of the 47th Design Automation Conference 2010
DOI: 10.1145/1837274.1837336
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Quality metric evaluation of a physical unclonable function derived from an IC's power distribution system

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Cited by 7 publications
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“…Interconnect variations in power-distribution networks was used for building a PUF by measuring the resistive differences of the wires [7,8]. This was accomplished by passive resistive circuit components to measure voltage drop.…”
Section: Introductionmentioning
confidence: 99%
“…Interconnect variations in power-distribution networks was used for building a PUF by measuring the resistive differences of the wires [7,8]. This was accomplished by passive resistive circuit components to measure voltage drop.…”
Section: Introductionmentioning
confidence: 99%