2009
DOI: 10.1117/12.808464
|View full text |Cite
|
Sign up to set email alerts
|

Quality evaluation of quasi-phase-matched devices by far-field diffraction pattern analysis

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2009
2009
2023
2023

Publication Types

Select...
4
1

Relationship

2
3

Authors

Journals

citations
Cited by 7 publications
references
References 7 publications
0
0
0
Order By: Relevance