2003
DOI: 10.1016/s0022-3697(03)00154-9
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Quality assessment of chalcopyrite thin films using Raman spectroscopy

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Cited by 21 publications
(21 citation statements)
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“…One is the desired CIS-chalcopyrite (CH) structure. The existence of CA structural domains hinders the carrier transport and therefore reduces the performance of the resulting devices [29,30,38]. Because of the extremely small difference in the formation energy, roughly 2 meV/atom, between CH and CA, the coexistence of the CH and CA easily occurs [37].…”
Section: Resultsmentioning
confidence: 99%
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“…One is the desired CIS-chalcopyrite (CH) structure. The existence of CA structural domains hinders the carrier transport and therefore reduces the performance of the resulting devices [29,30,38]. Because of the extremely small difference in the formation energy, roughly 2 meV/atom, between CH and CA, the coexistence of the CH and CA easily occurs [37].…”
Section: Resultsmentioning
confidence: 99%
“…However, depending on the sulfurization temperature and the Cu/In ratio, the CA/(CA + CH) peak intensity ratio varies, as shown in Figure 3. CIS films with a smaller FWHM have been reported to give a higher cell efficiency [29]. The broadened Raman peaks near 236 cm À1 are contributed by the E/B2 modes of the CH structure [39].…”
Section: Resultsmentioning
confidence: 99%
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“…8. The first order Raman scattering of a crystalline material with cubic structure usually shows two peaks corresponding to the transverse optic (TO) and longitudinal optic (LO) zone-centre phonon modes [26]. The observed peaks at about 206.8-207.0 and 411.1-412.1 cm −1 are assigned to the first order and second order ZnTe LO phonon scattering respectively.…”
Section: Thickness (Nm)mentioning
confidence: 99%