Effect of thickness on the microstructural, optoelectronic and morphological properties of electron beam evaporated ZnTe films

Balu, A. R.; Nagarethinam, V. S.; Thayumanavan, A.; Murali, K. R.; Sanjeeviraja, C.; Jayachandran, M.

doi:10.1016/j.jallcom.2010.04.191

Cited by 29 publications

(5 citation statements)

References 28 publications

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“…1) is a supporting evidence for this observed degradation. The crystallite size ( D ) is calculated from Scherrer formula 23 where λ is the wavelength of the X-ray used (1·5406 Å), β is the full width at half maximum and θ is the Bragg's angle. The calculated crystallite size and lattice parameter ‘ a ’ values are presented in Table 1.…”

Section: Resultsmentioning

confidence: 99%

Properties of Cd doped PbS thin films: doping concentration effect

Rajashree¹,

Balu²,

Nagarethinam³

2015

Surface Engineering

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Highly crystalline cadmium doped lead sulphide (PbS:Cd) thin films with different Cd doping concentrations (0, 2, 4, 6 and 8 at-%) were fabricated on glass substrates using spray pyrolysis technique. The X-ray diffraction (XRD) studies revealed that all the films exhibit face centred cubic structure with a preferential orientation along the (2 0 0) plane irrespective of Cd doping concentration. Optical studies showed that the band gap of doped films vary between 1?96 and 2?12 eV with increasing Cd content and the film coated with 6 at-% Cd dopant has a maximum transmittance of nearly equal to 77%. Electrical studies revealed that the film coated with 6 at-%Cd dopant has a maximum conductivity of 12?67610 21 V cm 21 . The obtained results infer that the PbS:Cd film coated with 6 at-%Cd dopant has better structural, morphological, optical and electrical properties.

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Section: Resultsmentioning

confidence: 99%

Properties of Cd doped PbS thin films: doping concentration effect

Rajashree¹,

Balu²,

Nagarethinam³

2015

Surface Engineering

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“…At this power level, we do not anticipate any deterioration of the sample under test. The two peaks at 203 and 404 cm −1 represent the first-and secondorder longitudinal optic (LO) [16] modes of ZnTe and hence provide a signature for identifying the material phase. Two peaks appearing at 125 and 141 cm −1 arise from elemental Te or Te-rich phases present in the layer [17].…”

Section: Raman Spectroscopymentioning

confidence: 99%

Development of ZnTe layers using an electrochemical technique for applications in thin-film solar cells

Fauzi¹,

Diso²,

Echendu³

et al. 2013

Semicond. Sci. Technol.

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Zinc telluride layers were grown by an electrochemical technique using acidic and aqueous solutions containing ZnCl 2 and TeO 2 . The layers were deposited on glass/fluorine-doped tin oxide substrates using a two-electrode system. The deposited ZnTe layers were characterized using x-ray diffraction, x-ray fluorescence, Raman spectroscopy, optical absorption, photoelectrochemical cell measurements, scanning electron microscopy and 3D-atomic force microscopy (3D-AFM) for the structural, optical, electrical and morphological properties. The electrodeposited ZnTe layers grow as columns, and have cubic crystal structure, the band gap in the range of (2.00-2.20) eV and p-type electrical conductivity. Surface morphology studies using SEM indicate the presence of two types of material clusters varying in size up to ∼125 nm. 3D-AFM studies with higher magnification show that the material tends to grow as columns with different sizes leaving gaps in between in some areas.

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“…The particle size and other structural parameters of ball milled samples have been calculated from respective XRD patterns using Scherrer formula and Williamson-Hall equation [18]. In Scherrer formula, the X-ray peak broadening,ˇ(excludingˇi) is considered solely for the small particle size (D) broadening (ˇD) and the contribution from lattice strain is ignored.…”

Section: Methods Of X-ray Analysismentioning

confidence: 99%

“…The particle size as well as lattice strain has been estimated using Williamson-Hall (W-H) equation [18].…”

Section: Methods Of X-ray Analysismentioning

confidence: 99%

Quickest single-step one pot mechanosynthesis and characterization of ZnTe quantum dots

Patra¹,

Pradhan²

2011

Journal of Alloys and Compounds

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Effect of thickness on the microstructural, optoelectronic and morphological properties of electron beam evaporated ZnTe films

Cited by 29 publications

References 28 publications

Properties of Cd doped PbS thin films: doping concentration effect

Properties of Cd doped PbS thin films: doping concentration effect

Development of ZnTe layers using an electrochemical technique for applications in thin-film solar cells

Quickest single-step one pot mechanosynthesis and characterization of ZnTe quantum dots

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