Abstract:The extensively explored unary and binary 2D layered materials (2DLMs) based photodetectors suffer from deficiencies of either poor stability, or indistinctive photoswitching, or poor scalability, or low durability to high‐temperature environment. Herein, a two‐step scenario, pulsed laser deposition (PLD) followed by post‐deposition annealing, is developed to produce centimeter‐scale 2D ZnIn2S4 (ZIS) nanofilms. Transport characterizations indicate that the as‐fabricated ZIS photodetectors manifest outstanding … Show more
“…35,36 Prior to the assembly of the heterostructures, the optimized growth conditions for preparing ZIS and SnS nanofilms have been systematically explored. The characterization results for pristine ZIS can be found in our preceding study, 20 while the characterization results for pristine SnS are summarized in Fig. S1 and S2 (ESI †).…”
Section: Resultsmentioning
confidence: 94%
“…S16, ESI †), which is comparable to that of a pristine ZIS photodetector. 20 On the whole, the comprehensive performance metrics of the SnS/ZIS photodetectors are on par with those of the state-of-the-art 2DLM based photodetectors (Table S1, ESI †) as well as 2DLM based heterojunction photodetectors (Table S2, ESI †). Of note, this strategy of integration of 3D-structured light-trapping SnS nanosheet networks is well compatible with many of the previously reported improvement methods such as dielectric engineering, 40 ferroelectric polarization coupling, 41 potential fluctuation engineering, 7 and multiple-gate modulation.…”
Section: Resultsmentioning
confidence: 97%
“…Of note, such a response rate is comparable to that of the PLD-derived pristine ZIS photodetector (≈15.3 ms/14.4 ms). 20 This is advantageous as compared to the previously reported surface engineering techniques, 23,52,53 where the de-trapping of the captured photocarriers is rather sluggish and the response/response time of the corresponding devices is thus commonly long. Moreover, it is to be emphasized that the response rate of the PLD-derived ZIS photodetectors is still much slower than that of the devices built of exfoliated ZIS single crystals in the current stage, 54,55 which indicates that the speed of the SnS/ZIS devices can probably be further accelerated by improving the crystallinity of the PLD-derived ZIS nanofilms in the future.…”
Section: Resultsmentioning
confidence: 99%
“…This is probably due to the outstanding thermal stability of both ZIS and SnS. 20,37 The Raman spectra of the PLD-derived ZIS, SnS and SnS/ZIS nanofilms upon 514 nm laser excitation are summarized in Fig. 1f.…”
Section: Resultsmentioning
confidence: 99%
“…In recent years, several 2DLMs with layer number-independent direct bandgap nature in a substantially wide thickness range have emerged, such as black phosphorus, 19 ZnIn 2 S 4 (ZIS), 20 In 2 Se 3 , 21 ReS 2 , 22 etc. As a consequence, the low light absorption issue of 2DLM optoelectronic devices can be addressed to some extent with these active materials by increasing the channel thickness.…”
A hierarchical SnS/ZnIn2S4 heterostructure with optical regulation and band tailoring is developed for high-performance broadband integrated optoelectronics.
“…35,36 Prior to the assembly of the heterostructures, the optimized growth conditions for preparing ZIS and SnS nanofilms have been systematically explored. The characterization results for pristine ZIS can be found in our preceding study, 20 while the characterization results for pristine SnS are summarized in Fig. S1 and S2 (ESI †).…”
Section: Resultsmentioning
confidence: 94%
“…S16, ESI †), which is comparable to that of a pristine ZIS photodetector. 20 On the whole, the comprehensive performance metrics of the SnS/ZIS photodetectors are on par with those of the state-of-the-art 2DLM based photodetectors (Table S1, ESI †) as well as 2DLM based heterojunction photodetectors (Table S2, ESI †). Of note, this strategy of integration of 3D-structured light-trapping SnS nanosheet networks is well compatible with many of the previously reported improvement methods such as dielectric engineering, 40 ferroelectric polarization coupling, 41 potential fluctuation engineering, 7 and multiple-gate modulation.…”
Section: Resultsmentioning
confidence: 97%
“…Of note, such a response rate is comparable to that of the PLD-derived pristine ZIS photodetector (≈15.3 ms/14.4 ms). 20 This is advantageous as compared to the previously reported surface engineering techniques, 23,52,53 where the de-trapping of the captured photocarriers is rather sluggish and the response/response time of the corresponding devices is thus commonly long. Moreover, it is to be emphasized that the response rate of the PLD-derived ZIS photodetectors is still much slower than that of the devices built of exfoliated ZIS single crystals in the current stage, 54,55 which indicates that the speed of the SnS/ZIS devices can probably be further accelerated by improving the crystallinity of the PLD-derived ZIS nanofilms in the future.…”
Section: Resultsmentioning
confidence: 99%
“…This is probably due to the outstanding thermal stability of both ZIS and SnS. 20,37 The Raman spectra of the PLD-derived ZIS, SnS and SnS/ZIS nanofilms upon 514 nm laser excitation are summarized in Fig. 1f.…”
Section: Resultsmentioning
confidence: 99%
“…In recent years, several 2DLMs with layer number-independent direct bandgap nature in a substantially wide thickness range have emerged, such as black phosphorus, 19 ZnIn 2 S 4 (ZIS), 20 In 2 Se 3 , 21 ReS 2 , 22 etc. As a consequence, the low light absorption issue of 2DLM optoelectronic devices can be addressed to some extent with these active materials by increasing the channel thickness.…”
A hierarchical SnS/ZnIn2S4 heterostructure with optical regulation and band tailoring is developed for high-performance broadband integrated optoelectronics.
Sensitivity and detection limit of X‐ray detectors are crucial for security checks, medical diagnoses, and industrial inspections. In this study, it is reported that introducing some cations containing lone‐pair electrons is beneficial for enhancing the Compton scattering effect and thus improving X‐ray detection performance. As an example, SnTe3O8 is selected and grown as a novel high‐temperature X‐ray detection crystal. Because of the high resistivity of 2 × 1014 Ω cm and high mobility lifetime product of 3.22 × 10−4 cm2 V−1, SnTe3O8 X‐ray detector exhibits a high sensitivity of 436 µC Gyair−1 cm−2 under 120 keV hard X‐ray, a low dark current drift of 2.44 × 10−9 nA cm−1 s−1 V−1 and a record low detection limit of 8.19 nGyair s−1 among all oxide X‐ray detectors. Furthermore, the high‐temperature sensitivity of SnTe3O8 X‐ray detector is enhanced to 617 µC Gyair−1 cm−2 at 175 °C, which is ≈31 times larger than that of the commercial α‐Se. The high thermal stability and stable high‐temperature sensitivity of SnTe3O8 single crystal X‐ray detectors have potential applications in high‐temperature environments. The results not only provide an excellent high‐temperature X‐ray detection crystal but also propose an effective method to explore X‐ray detector materials with excellent performances.
Due to the limits of the physical properties of conventional semiconductors against harsh environments, seeking a suitable material for next-generation photoconversion devices with high-temperature stability and strong radiation hardness has become a hot issue. Here, visible-light photodetectors are fabricated on an N-doped diamond. Their visible-light detection via charge-neutralized impurity levels including multi-complex mid-gap states induced crystal defects shows photosensitivity of at least four orders (10 4 ), the visible responsivity of 0.08 A W −1 , and the detectivity of 3.9 × 10 12 Jones. No significant deterioration of such figures of merit of photodetectors is observed even at an environmental temperature of 250 °C and after absorption to 10 MGy in the dose of white X-ray. N-doped diamond shows excellent potential to be applicable to visible-light photodetectors for harsh-environmental implementations, which conventional visible-light photodetectors are not capable of so far.
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