Pulsed laser deposition and characterization of La1−xSrxMnO3

Calderón, Sandra Krick; Escobar‐Alarcón, L.; Camps, E.; Rodil, S.E.; Betancourt, I.; Olaya, Jhon J

doi:10.1016/j.mssp.2012.03.009

Cited by 4 publications

(2 citation statements)

References 14 publications

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“…The line shape and the values of the dielectric function are consistent with those of LSMO deposited on STO as reported by Veis et al, [27] but they differ significantly from the dielectric function of LSMO films grown on Si(100) reported by Calderón et al [28] This discrepancy can be explained by the fact that Calderón et al annealed the LSMO films at 900 C. This may have caused the growth of SiO x and an interdiffusion between silicon oxide and LSMO, which were not accounted for in their calculation of the dielectric function.…”

Section: Variable-angle Spectroscopic Ellipsometry (Vase)supporting

confidence: 87%

“…The dielectric functions of the layers were assumed to be optically isotropic due to their amorphous structure. The model took into account the dielectric functions of silicon from the study by Veis et al [ 27 ] (with a thickness of 1 mm) and of silicon oxide from the study by Calderon et al [ 28 ] (with a thickness of 2 nm). A general oscillator layer with variable thickness was applied to account for the LSMO layer.…”

Section: Resultsmentioning

confidence: 99%

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La_1−xSr_xMnO₃ Thin Films on Silicon Prepared by Magnetron Sputtering: Optimization of the Film Structure and Magnetic Properties by Postdeposition Annealing

Monecke

Richter

Bülz

et al. 2021

Physica Status Solidi (b)

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Herein, a systematic study of postdeposition annealing for La1−xSrxMnO3 (LSMO) films regarding their structural, electronic, (magneto‐)optical, and magnetic properties is presented. The samples are prepared by magnetron sputtering at room temperature on silicon (111) substrates with native oxide and are annealed in ambient atmosphere for 12 h in a temperature range from 600 to 875 °C. The stoichiometry of the films is investigated by X‐ray photoelectron spectroscopy (XPS), and Raman spectroscopy is utilized to investigate the vibrational modes of the films. The diagonal and off‐diagonal components of the dielectric tensor are investigated by variable‐angle spectroscopic ellipsometry and magneto‐optic Kerr effect (MOKE) spectroscopy, respectively. The remanence and the coercive field of the layers are characterized by superconducting quantum interference device (SQUID) magnetometry. The magnetic properties are found to improve with increasing annealing temperature up to 850 °C, whereas the resistivity remains within a range between 0.5 and 2 Ωcm. The highest suitable annealing temperature for applications is, however, 775 °C due to the formation of a diffusion layer between LSMO and silicon oxide at higher temperatures.

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Section: Variable-angle Spectroscopic Ellipsometry (Vase)supporting

confidence: 87%

Section: Resultsmentioning

confidence: 99%

La_1−xSr_xMnO₃ Thin Films on Silicon Prepared by Magnetron Sputtering: Optimization of the Film Structure and Magnetic Properties by Postdeposition Annealing

Monecke

Richter

Bülz

et al. 2021

Physica Status Solidi (b)

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Structural and Magnetic Properties of La1−x(Ca,Sr)xMnO3 Powders Produced by the Hydrothermal Method

Londoño-Calderón

Rave-Osorio

Restrepo

et al. 2018

J Supercond Nov Magn

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Calcium manganate: A promising candidate as buffer layer for hybrid halide perovskite photovoltaic-thermoelectric systems

Zhao

Wang

et al. 2014

Journal of Applied Physics

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We have systematically studied the feasibility of CaMnO3 thin film, an n-type perovskite, to be utilized as the buffer layer for hybrid halide perovskite photovoltaic-thermoelectric device. Locations of the conduction band and the valence band, spontaneous polarization performance, and optical properties were investigated. Results indicate the energy band of CaMnO3 can match up well with that of CH3NH3PbI3 on separating electron-hole pairs. In addition, the consistent polarization angle helps enlarge the open circuit voltage of the composite system. Besides, CaMnO3 film shows large absorption coefficient and low extinction coefficient under visible irradiation, demonstrating high carrier concentration, which is beneficial to the current density. More importantly, benign thermoelectric properties enable CaMnO3 film to assimilate phonon vibration from CH3NH3PbI3. All the above features lead to a bright future of CaMnO3 film, which can be a promising candidate as a buffer layer for hybrid halide perovskite photovoltaic-thermoelectric systems.

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Pulsed laser deposition and characterization of La1−xSrxMnO3

Cited by 4 publications

References 14 publications

La_1−xSr_xMnO₃ Thin Films on Silicon Prepared by Magnetron Sputtering: Optimization of the Film Structure and Magnetic Properties by Postdeposition Annealing

La_1−xSr_xMnO₃ Thin Films on Silicon Prepared by Magnetron Sputtering: Optimization of the Film Structure and Magnetic Properties by Postdeposition Annealing

Structural and Magnetic Properties of La1−x(Ca,Sr)xMnO3 Powders Produced by the Hydrothermal Method

Calcium manganate: A promising candidate as buffer layer for hybrid halide perovskite photovoltaic-thermoelectric systems

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Pulsed laser deposition and characterization of La1−xSrxMnO3

Cited by 4 publications

References 14 publications

La1−xSrxMnO3 Thin Films on Silicon Prepared by Magnetron Sputtering: Optimization of the Film Structure and Magnetic Properties by Postdeposition Annealing

La1−xSrxMnO3 Thin Films on Silicon Prepared by Magnetron Sputtering: Optimization of the Film Structure and Magnetic Properties by Postdeposition Annealing

Structural and Magnetic Properties of La1−x(Ca,Sr)xMnO3 Powders Produced by the Hydrothermal Method

Calcium manganate: A promising candidate as buffer layer for hybrid halide perovskite photovoltaic-thermoelectric systems

Contact Info

Product

Resources

About

La_1−xSr_xMnO₃ Thin Films on Silicon Prepared by Magnetron Sputtering: Optimization of the Film Structure and Magnetic Properties by Postdeposition Annealing

La_1−xSr_xMnO₃ Thin Films on Silicon Prepared by Magnetron Sputtering: Optimization of the Film Structure and Magnetic Properties by Postdeposition Annealing